Inventor · disambiguated record
John M. Sedlak
Also filed as: SEDLAK JOHN M · SEDLAK JOHN MICHAEL
12 granted patents·1 pending application·274 citations·filing 1974–2003
92Inventor score
Top patents by PatentIndex Score
13 records- 0195US4333805AHalogen evolution with improved anode catalystGEN ELECTRIC·Filed 1981·Granted Jun 8, 1982·90 cites·21 claims
- 0286US4289591AOxygen evolution with improved Mn stabilized catalystGEN ELECTRIC·Filed 1980·Granted Sep 15, 1981·36 cites·12 claims
- 0380US4042464AMethod for the detection and measurement of noxious gasesENERGETICS SCIENCE·Filed 1975·Granted Aug 16, 1977·28 cites·4 claims
- 0476US4127462ADevice for the detection and measurement of noxious gasesENERGETICS SCIENCE·Filed 1977·Granted Nov 28, 1978·24 cites·13 claims
- 0575US4001103ADevice for the detection and measurement of NO and NO2 gasesENERGETICS SCIENCE·Filed 1974·Granted Jan 4, 1977·24 cites·9 claims
- 0670US4294608ACatalytic alloysGEN ELECTRIC·Filed 1980·Granted Oct 13, 1981·22 cites·21 claims
- 0759US4360416AAnode catalysts for electrolysis of brineGEN ELECTRIC·Filed 1981·Granted Nov 23, 1982·12 cites·5 claims
- 0859US4052268AMethod for the detection and measurement of nitric oxide, nitrogen dioxide and mixtures thereofENERGETICS SCIENCE·Filed 1976·Granted Oct 4, 1977·15 cites·6 claims
- 0957US6487470B1Method and apparatus for determining magnet wire production die setsGEN ELECTRIC·Filed 2000·Granted Nov 26, 2002·7 cites·15 claims
- 1043US6492626B1Method and system for regulating a temperature of coupling formationsGEN ELECTRIC·Filed 2000·Granted Dec 10, 2002·2 cites·21 claims
- 1140US6343259B1Methods and apparatus for electrical connection inspectionGEN ELECTRIC·Filed 1997·Granted Jan 29, 2002·7 cites·20 claims
- 1240US5733041AMethods and apparatus for electrical connection inspectionGEN ELECTRIC·Filed 1995·Granted Mar 31, 1998·7 cites·28 claims
- 1337US2004182596A1Method and apparatus for insulating magnet wireFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →