Inventor · disambiguated record
Erwin E. Yu
Also filed as: YU ERWIN · YU ERWIN E
24 granted patents·5 pending applications·60 citations·filing 2006–2025
94Inventor score
Top patents by PatentIndex Score
29 records- 0196US11562791B1Memory devices with four data line bias levelsMICRON TECHNOLOGY INC·Filed 2021·Granted Jan 24, 2023·6 cites·24 claims
- 0295US11335412B2Managing sub-block erase operations in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2020·Granted May 17, 2022·5 cites·20 claims
- 0392US11749353B2Managing sub-block erase operations in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2022·Granted Sep 5, 2023·2 cites·20 claims
- 0488US11532367B2Managing programming convergence associated with memory cells of a memory sub-systemMICRON TECHNOLOGY INC·Filed 2020·Granted Dec 20, 2022·2 cites·20 claims
- 0588US11442091B2Apparatus and methods for determination of capacitive and resistive characteristics of access linesMICRON TECHNOLOGY INC·Filed 2020·Granted Sep 13, 2022·2 cites·20 claims
- 0688US10163500B1Sense matching for hard and soft memory readsINTEL CORP·Filed 2017·Granted Dec 25, 2018·7 cites·27 claims
- 0786US7663925B2Method and apparatus for programming flash memoryMICRON TECHNOLOGY INC·Filed 2006·Granted Feb 16, 2010·15 cites·42 claims
- 0880US7974129B2Method and apparatus for programming flash memoryMICRON TECHNOLOGY INC·Filed 2010·Granted Jul 5, 2011·6 cites·18 claims
- 0979US2025008727A1Memory devices and electronic systemsMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1077US12068037B2Managing sub-block erase operations in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2023·Granted Aug 20, 2024·0 cites·20 claims
- 1177US9842655B2Reducing verification checks when programming a memory deviceINTEL CORP·Filed 2015·Granted Dec 12, 2017·4 cites·20 claims
- 1276US10127988B2Temperature compensation in memory sensingMICRON TECHNOLOGY INC·Filed 2016·Granted Nov 13, 2018·4 cites·26 claims
- 1375US9633744B2On demand knockout of coarse sensing based on dynamic source bounce detectionINTEL CORP·Filed 2015·Granted Apr 25, 2017·4 cites·29 claims
- 1473US2025098159A1Memory devices including pad structuresMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1571US11915758B2Memory devices with four data line bias levelsMICRON TECHNOLOGY INC·Filed 2023·Granted Feb 27, 2024·0 cites·20 claims
- 1670US11862257B2Managing programming convergence associated with memory cells of a memory sub-systemMICRON TECHNOLOGY INC·Filed 2022·Granted Jan 2, 2024·0 cites·20 claims
- 1766US12101932B2Microelectronic devices, and related memory devices and electronic systemsMICRON TECHNOLOGY INC·Filed 2021·Granted Sep 24, 2024·0 cites·25 claims
- 1865US12171096B2Microelectronic devices, and related memory devices and electronic systemsMICRON TECHNOLOGY INC·Filed 2021·Granted Dec 17, 2024·0 cites·24 claims
- 1965US2025384907A1Bias current generation methods and systems for fast current sensingMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 2064US12183396B2Memory array structures and methods of forming memory array structuresMICRON TECHNOLOGY INC·Filed 2023·Granted Dec 31, 2024·0 cites·20 claims
- 2164US2024203508A1Selective management of erase operations in memory devices that enable suspend commandsMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 2261US11942159B2Selective management of erase operations in memory devices that enable suspend commandsMICRON TECHNOLOGY INC·Filed 2022·Granted Mar 26, 2024·0 cites·20 claims
- 2360US10049759B2Reducing verification checks when programming a memory deviceINTEL CORP·Filed 2017·Granted Aug 14, 2018·1 cites·22 claims
- 2458US8179726B2Method and apparatus for programming flash memoryYU ERWIN E·Filed 2011·Granted May 15, 2012·2 cites·20 claims
- 2556US11557341B2Memory array structures and methods for determination of resistive characteristics of access linesMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 17, 2023·0 cites·36 claims
- 2653US11557351B2Sense circuit to sense two states of a memory cellMICRON TECHNOLOGY INC·Filed 2021·Granted Jan 17, 2023·0 cites·20 claims
- 2752US12276686B2Apparatus for determination of capacitive and resistive characteristics of access linesMICRON TECHNOLOGY INC·Filed 2022·Granted Apr 15, 2025·0 cites·21 claims
- 2850US2024428862A1Seeding bias control for sub-block groups in a memory deviceMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 2943US10790029B2Temperature compensation in memory sensingMICRON TECHNOLOGY INC·Filed 2018·Granted Sep 29, 2020·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →