Inventor · disambiguated record
Alan D. Norris
Also filed as: NORRIS ALAN D
9 granted patents·1 pending application·84 citations·filing 1999–2009
87Inventor score
Files withIBM10
Top patents by PatentIndex Score
10 records- 0172US6330697B1Apparatus and method for performing a defect leakage screen test for memory devicesIBM·Filed 1999·Granted Dec 11, 2001·36 cites·35 claims
- 0271US6658604B1Method for testing and guaranteeing that skew between two signals meets predetermined criteriaIBM·Filed 2000·Granted Dec 2, 2003·16 cites·26 claims
- 0364US7221601B2Timer lockout circuit for synchronous applicationsIBM·Filed 2006·Granted May 22, 2007·5 cites·18 claims
- 0462US6708298B2Method for guaranteeing a minimum data strobe valid window and a minimum data valid window for DDR memory devicesIBM·Filed 2001·Granted Mar 16, 2004·13 cites·19 claims
- 0556US8008142B2Self-aligned Schottky diodeIBM·Filed 2009·Granted Aug 30, 2011·0 cites·19 claims
- 0656US7194670B2Command multiplier for built-in-self-testIBM·Filed 2004·Granted Mar 20, 2007·9 cites·8 claims
- 0742US7463548B2Method for performing a burn-in testIBM·Filed 2007·Granted Dec 9, 2008·1 cites·6 claims
- 0839US7068564B2Timer lockout circuit for synchronous applicationsIBM·Filed 2003·Granted Jun 27, 2006·2 cites·20 claims
- 0935US7243276B2Method for performing a burn-in testIBM·Filed 2003·Granted Jul 10, 2007·2 cites·21 claims
- 1031US2004133827A1Internal data generation and compare via unused external pinsIBM·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →