Inventor · disambiguated record
Stephen F. Blazo
Also filed as: BLAZO STEPHEN · BLAZO STEPHEN F · BLAZO STEPHEN FRANK
11 granted patents·5 pending applications·341 citations·filing 1977–2019
92Inventor score
Top patents by PatentIndex Score
16 records- 0193US5742208ASignal generator for generating a jitter/wander outputTEKTRONIX INC·Filed 1996·Granted Apr 21, 1998·68 cites·12 claims
- 0281US4995044ALaser diode impulse circuitTEKTRONIX INC·Filed 1990·Granted Feb 19, 1991·44 cites·2 claims
- 0377US5757652AElectrical signal jitter and wander measurement system and methodTEKTRONIX INC·Filed 1995·Granted May 26, 1998·54 cites·44 claims
- 0473US5754437APhase measurement apparatus and methodTEKTRONIX INC·Filed 1996·Granted May 19, 1998·91 cites·111 claims
- 0573US4868380AOptical waveguide photocathodeTEKTRONIX INC·Filed 1988·Granted Sep 19, 1989·18 cites·29 claims
- 0673US4736250ADigital camera frame capture circuitTEKTRONIX INC·Filed 1986·Granted Apr 5, 1988·27 cites·10 claims
- 0765US6785345B2Frequency dithering for DDS spectral purityTEKTRONIX INC·Filed 2001·Granted Aug 31, 2004·11 cites·2 claims
- 0858US4791589AProcessing circuit for capturing event in digital camera systemTEKTRONIX INC·Filed 1986·Granted Dec 13, 1988·17 cites·10 claims
- 0942US2020280169A1Laser Calibration SystemBLAZO STEPHEN·Filed 2019·Application pending·0 cites
- 1037US2003132375A1Tunable laser calibration systemFiled 2002·Application pending·0 cites
- 1137US2003113114A1Wavelength calibration system using out of band gas cell linesFiled 2001·Application pending·0 cites
- 1236US2018205198A1Optical Test System Using an Array LaserBLAZO STEPHEN FRANK·Filed 2017·Application pending·0 cites
- 1336US2002121592A1Extended range frequency calibration deviceFiled 2001·Application pending·0 cites
- 1434US4130775ACharge image charge transfer cathode ray tube having a scan expansion electron lens system and collimation electrode meansTEKTRONIX INC·Filed 1977·Granted Dec 19, 1978·4 cites·14 claims
- 1530US4791339ALiquid crystal light valve with spatially uniform light transmittance characteristicsTEKTRONIX INC·Filed 1987·Granted Dec 13, 1988·6 cites·2 claims
- 1630US4775244AMethod and apparatus for measurement of pulse width of very short pulsesTEKTRONIX INC·Filed 1987·Granted Oct 4, 1988·1 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →