Inventor · disambiguated record
Jean-Michel Cioranesco
Also filed as: CIORANESCO JEAN-MICHEL
9 granted patents·3 pending applications·16 citations·filing 2014–2023
82Inventor score
Top patents by PatentIndex Score
12 records- 0182US9853974B2Implementing access control by system-on-chipCRYPTOGRAPHY RES INC·Filed 2015·Granted Dec 26, 2017·6 cites·36 claims
- 0278US11018849B2Hardware masked substitution box for the data encryption standardCRYPTOGRAPHY RES INC·Filed 2019·Granted May 25, 2021·2 cites·20 claims
- 0377US11743028B2Protecting block cipher computation operations from external monitoring attacksCRYPTOGRAPHY RES INC·Filed 2020·Granted Aug 29, 2023·1 cites·13 claims
- 0471US10461925B2Hardware masked substitution box for the data encryption standardCRYPTOGRAPHY RES INC·Filed 2017·Granted Oct 29, 2019·1 cites·5 claims
- 0571US9514308B2Tamper detection arrangement for integrated circuitsQATAR FOUNDATION·Filed 2014·Granted Dec 6, 2016·3 cites·28 claims
- 0667US10771235B2Protecting block cipher computation operations from external monitoring attacksCRYPTOGRAPHY RES INC·Filed 2017·Granted Sep 8, 2020·1 cites·9 claims
- 0767US10489611B2Low overhead random pre-charge countermeasure for side-channel attacksCRYPTOGRAPHY RES INC·Filed 2016·Granted Nov 26, 2019·1 cites·20 claims
- 0863US10482275B2Implementing access control by system-on-chipCRYPTOGRAPHY RES INC·Filed 2015·Granted Nov 19, 2019·1 cites·19 claims
- 0959US11200348B2Low overhead random pre-charge countermeasure for side-channel attacksCRYPTOGRAPHY RES INC·Filed 2019·Granted Dec 14, 2021·0 cites·20 claims
- 1058US2025199065A1Device under test, fault injection testing system and method for fault injection testing using an on-chip fault testing moduleNXP BV·Filed 2023·Application pending·0 cites
- 1155US2020125756A1Implementing access control by system-on-chipCRYPTOGRAPHY RES INC·Filed 2019·Application pending·0 cites
- 1252US2024393391A1System and method for detecting faults in integrated circuitsNXP BV·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →