Inventor · disambiguated record
Angus Bewick
Also filed as: BEWICK ANGUS
6 granted patents·3 pending applications·46 citations·filing 2002–2025
79Inventor score
Files withOXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LTD5OXFORD INSTR NANOTECHNOLOGY TOOLS LTD2BEWICK ANGUS1RENISHAW PLC1
Top patents by PatentIndex Score
9 records- 0187US8049182B2Charged particle filterOXFORD INSTR NANOTECHNOLOGY TOOLS LTD·Filed 2010·Granted Nov 1, 2011·13 cites·13 claims
- 0284US6885445B2Electron microscope and spectroscopy systemRENISHAW PLC·Filed 2002·Granted Apr 26, 2005·28 cites·26 claims
- 0375US11139137B2Collision avoidance for particle beam instrumentsOXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LTD·Filed 2018·Granted Oct 5, 2021·2 cites·18 claims
- 0474US8890065B2Apparatus and method for performing microdiffraction analysisOXFORD INSTR NANOTECHNOLOGY TOOLS LTD·Filed 2012·Granted Nov 18, 2014·3 cites·30 claims
- 0566US11798774B2Collision avoidance for particle beam instrumentsOXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LTD·Filed 2021·Granted Oct 24, 2023·0 cites·18 claims
- 0656US2025314603A1Method of obtaining a modified image of a specimenOXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LTD·Filed 2025·Application pending·0 cites
- 0750US2023175991A1Improved camera for electron diffraction pattern analysisOXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LTD·Filed 2021·Application pending·0 cites
- 0844US2012273679A1X-ray analyserBEWICK ANGUS·Filed 2009·Application pending·0 cites
- 0941US11195692B2System for electron diffraction analysisOXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LTD·Filed 2018·Granted Dec 7, 2021·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →