Inventor · disambiguated record
Scott Warrick
Also filed as: WARRICK SCOTT · WARRICK SCOTT P
7 granted patents·4 pending applications·21 citations·filing 2005–2023
79Inventor score
Files withCIRRUS LOGIC INT SEMICONDUCTOR LTD4FREESCALE SEMICONDUCTOR INC3WARRICK SCOTT3SHARMA PUNEET1
Top patents by PatentIndex Score
11 records- 0184US10586865B2Dual gate metal-oxide-semiconductor field-effect transistorCIRRUS LOGIC INT SEMICONDUCTOR LTD·Filed 2017·Granted Mar 10, 2020·6 cites·46 claims
- 0276US8898614B2Integrated circuit device with reduced leakage and method thereforSHARMA PUNEET·Filed 2010·Granted Nov 25, 2014·5 cites·18 claims
- 0376US7948607B2Immersion lithography apparatus and method of performing immersion lithographyFREESCALE SEMICONDUCTOR INC·Filed 2005·Granted May 24, 2011·5 cites·20 claims
- 0466US8187978B2Method of forming openings in a semiconductor device and semiconductor deviceWARRICK SCOTT·Filed 2007·Granted May 29, 2012·3 cites·20 claims
- 0555US2024125854A1Electrochemical cell characterisationCIRRUS LOGIC INT SEMICONDUCTOR LTD·Filed 2023·Application pending·0 cites
- 0654US8435874B2Method of forming openings in a semiconductor device and a semiconductor device fabricated by the methodWARRICK SCOTT·Filed 2008·Granted May 7, 2013·2 cites·20 claims
- 0752US12482668B2Integrated circuit with getter layer for hydrogen entrapmentCIRRUS LOGIC INT SEMICONDUCTOR LTD·Filed 2023·Granted Nov 25, 2025·0 cites·15 claims
- 0843US7837762B2Method of distancing a bubble and bubble displacement apparatusFREESCALE SEMICONDUCTOR INC·Filed 2005·Granted Nov 23, 2010·0 cites·13 claims
- 0943US2020006551A1Laterally diffused metal oxide semiconductor transistor and a method of manufacture of the sameCIRRUS LOGIC INT SEMICONDUCTOR LTD·Filed 2019·Application pending·0 cites
- 1040US2009134496A1Wafer and method of forming alignment markersFREESCALE SEMICONDUCTOR INC·Filed 2006·Application pending·0 cites
- 1136US2021082811A1Fabrication of integrated circuit including passive electrical componentWARRICK SCOTT·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →