Inventor · disambiguated record
Young-Gu Shin
Also filed as: SHIN YOUNG-GU
3 granted patents·1 pending application·10 citations·filing 2002–2005
63Inventor score
Files withSAMSUNG ELECTRONICS CO LTD4
Top patents by PatentIndex Score
4 records- 0159US7327154B2Multichip package testSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Feb 5, 2008·3 cites·4 claims
- 0254US6943577B2Multichip package testSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Sep 13, 2005·6 cites·2 claims
- 0333US7012443B2System used to test plurality of DUTs in parallel and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Mar 14, 2006·1 cites·26 claims
- 0429US2003115519A1Parallel testing system for semiconductor memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →