Inventor · disambiguated record
Shigeru Takada
Also filed as: TAKADA SHIGERU
10 granted patents·1 pending application·187 citations·filing 1992–2012
89Inventor score
Files withMITSUBISHI ELECTRIC CORP4MITSUBA ELECTRIC MFG CO2RENESAS TECH CORP2ISHIZUKA ELECTRONICS CORP1MISUBISHI DENKI KABUSHIKI KAIS1
Top patents by PatentIndex Score
11 records- 0189US6344753B1Test socket having improved contact terminals, and method of forming contact terminals of the test socketMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Feb 5, 2002·64 cites·8 claims
- 0287US6794890B1Test socket, method of manufacturing the test socket, test method using the test socket, and member to be testedMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Sep 21, 2004·48 cites·5 claims
- 0379US7441950B2Probe for electronic clinical thermometerISHIZUKA ELECTRONICS CORP·Filed 2006·Granted Oct 28, 2008·14 cites·7 claims
- 0466US5185544AVentilation structure in a vertically mounted motorMITSUBA ELECTRIC MFG CO·Filed 1992·Granted Feb 9, 1993·32 cites·10 claims
- 0559US6621286B2System and method for inspecting a semiconductor device with contact sections that slide over the terminals of the semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Sep 16, 2003·10 cites·11 claims
- 0649US7498180B2Method for manufacturing semiconductor deviceRENESAS TECH CORP·Filed 2006·Granted Mar 3, 2009·1 cites·11 claims
- 0748US7112976B2Test socket, method of manufacturing the test socket, test method using the test socket, and member to be testedMISUBISHI DENKI KABUSHIKI KAIS·Filed 2004·Granted Sep 26, 2006·3 cites·8 claims
- 0844US7662647B2Method for manufacturing semiconductor deviceRENESAS TECH CORP·Filed 2008·Granted Feb 16, 2010·0 cites·4 claims
- 0943US5338995ACasing structure of a motorMITSUBA ELECTRIC MFG CO·Filed 1993·Granted Aug 16, 1994·13 cites·12 claims
- 1041US2013115722A1Method for manufacturing a semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2012·Application pending·0 cites
- 1140US6384470B2Contact terminal element, contact terminal deviceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted May 7, 2002·2 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →