Inventor · disambiguated record
Mitsushiro Yamaguchi
Also filed as: YAMAGUCHI MITSUSHIRO
15 granted patents·3 pending applications·45 citations·filing 2008–2019
89Inventor score
Top patents by PatentIndex Score
18 records- 0192US8471220B2Optical analysis device, optical analysis method and computer program for optical analysisYAMAGUCHI MITSUSHIRO·Filed 2012·Granted Jun 25, 2013·13 cites·24 claims
- 0289US8541759B2Optical analysis device, optical analysis method and computer program for optical analysisYAMAGUCHI MITSUSHIRO·Filed 2012·Granted Sep 24, 2013·8 cites·24 claims
- 0387US8710413B2Optical analysis device, optical analysis method and computer program for optical analysisYAMAGUCHI MITSUSHIRO·Filed 2012·Granted Apr 29, 2014·6 cites·26 claims
- 0486US9329117B2Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detectionOLYMPUS CORP·Filed 2014·Granted May 3, 2016·6 cites·12 claims
- 0580US8681332B2Method of measuring a diffusion characteristic value of a particleOLYMPUS CORP·Filed 2013·Granted Mar 25, 2014·3 cites·7 claims
- 0679US8803106B2Optical analysis device, optical analysis method and computer program for optical analysis for observing polarization characteristics of a single light-emitting particleOLYMPUS CORP·Filed 2013·Granted Aug 12, 2014·3 cites·26 claims
- 0778US8785886B2Optical analysis method using the light intensity of a single light-emitting particleOLYMPUS CORP·Filed 2013·Granted Jul 22, 2014·3 cites·10 claims
- 0875US9423349B2Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detectionOLYMPUS CORP·Filed 2014·Granted Aug 23, 2016·3 cites·27 claims
- 0949US9103718B2Optical analysis device and optical analysis method using a wavelength characteristic of light of a single light-emitting particleOLYMPUS CORP·Filed 2013·Granted Aug 11, 2015·0 cites·12 claims
- 1049US8958066B2Optical analysis method using measurement of light of two or more wavelength bandsOLYMPUS CORP·Filed 2013·Granted Feb 17, 2015·0 cites·15 claims
- 1148US11119022B2Optical analysis device, optical analysis method, and recording mediumOLYMPUS CORP·Filed 2019·Granted Sep 14, 2021·0 cites·20 claims
- 1248US9435727B2Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detectionOLYMPUS CORP·Filed 2013·Granted Sep 6, 2016·0 cites·21 claims
- 1346US10371631B2Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detectionOLYMPUS CORP·Filed 2014·Granted Aug 6, 2019·0 cites·18 claims
- 1441US10310245B2Optical microscope device, microscopic observation method and computer program for microscopic observation using single light-emitting particle detection techniqueOLYMPUS CORP·Filed 2016·Granted Jun 4, 2019·0 cites·12 claims
- 1541US9797839B2System for applying phantom sample to evaluate optical analysis device, storage device storing instructions, method and phantom sampleOLYMPUS CORP·Filed 2015·Granted Oct 24, 2017·0 cites·19 claims
- 1641US2008117421A1Optical measurement apparatusOLYMPUS CORP·Filed 2008·Application pending·0 cites
- 1739US2010301231A1Apparatus, method and computer program for fluorescence correlation spectroscopyOLYMPUS CORP·Filed 2010·Application pending·0 cites
- 1834US2015168212A1Optical analysis device, optical analysis method and computer program for optical analysis, using an optical system of a confocal microscope or a multiphoton microscopeOLYMPUS CORP·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →