Inventor · disambiguated record
Felix Kerstan
Also filed as: KERSTAN FELIX
14 granted patents·4 pending applications·77 citations·filing 1988–2021
90Inventor score
Files withZEISS CARL MICROIMAGING GMBH7ZEISS CARL JENA GMBH3CARL ZEISS SPECTROSCOPY GMBH2JENOPTIK JENA GMBH2KERSTAN FELIX2
Top patents by PatentIndex Score
18 records- 0175US7369228B2Compact spectrometerZEISS CARL MICROIMAGING GMBH·Filed 2003·Granted May 6, 2008·22 cites·10 claims
- 0265US7692790B2Grating spectrometer system and method for the acquisition of measured valuesZEISS CARL MICROIMAGING GMBH·Filed 2006·Granted Apr 6, 2010·4 cites·12 claims
- 0365US6762409B2Method and device for determining the thickness and growth rate of an ice layerZEISS CARL JENA GMBH·Filed 2002·Granted Jul 13, 2004·13 cites·27 claims
- 0464US7502108B2Assembly and method for identifying coatings lying on the surface of components and for determining their characteristicsZEISS CARL MICROIMAGING GMBH·Filed 2004·Granted Mar 10, 2009·5 cites·5 claims
- 0560US6888637B2Gas sample vessel for a gas analyzerZEISS CARL JENA GMBH·Filed 2002·Granted May 3, 2005·4 cites·11 claims
- 0655US4856898AAdjustable echelle spectrometer arrangement and method for its adjustmentJENOPTIK JENA GMBH·Filed 1988·Granted Aug 15, 1989·18 cites·6 claims
- 0749US6654186B2Arrangement for fixing an optical component partZEISS CARL JENA GMBH·Filed 2002·Granted Nov 25, 2003·3 cites·9 claims
- 0845US12158414B2Plurality of structurally identical spectrometers and a calibration method thereforCARL ZEISS SPECTROSCOPY GMBH·Filed 2021·Granted Dec 3, 2024·0 cites·15 claims
- 0945US7573023B2Arrangement and method for compensation of the temperature dependency of detectors in spectrometersZEISS CARL MICROIMAGING GMBH·Filed 2006·Granted Aug 11, 2009·1 cites·6 claims
- 1045US2011007319A1Arrangement for Determining the Reflectivity of a SampleZEISS CARL MICROIMAGING GMBH·Filed 2008·Application pending·0 cites
- 1144US11940378B2Spectrometer system and method for testing of sameCARL ZEISS SPECTROSCOPY GMBH·Filed 2019·Granted Mar 26, 2024·0 cites·28 claims
- 1243US2011255075A1Spectrometric assembly and method for determining a temperature value for a detector of a spectrometerZEISS CARL MICROIMAGING GMBH·Filed 2009·Application pending·0 cites
- 1341US2012105847A1Spectrometric measurement system and method for compensating for veiling glareKERSTAN FELIX·Filed 2012·Application pending·0 cites
- 1440US7082003B2Pressure compensating device for optical apparatusCAR ZEISS JENA GMBH·Filed 2002·Granted Jul 25, 2006·2 cites·12 claims
- 1538US8111396B2Spectrometric measurement system and method for compensating for veiling glareKERSTAN FELIX·Filed 2007·Granted Feb 7, 2012·0 cites·18 claims
- 1634US4979823AMethod and arrangement for background compensation in material analysisJENOPTIK JENA GMBH·Filed 1988·Granted Dec 25, 1990·5 cites·5 claims
- 1732US2010321686A1Device for optical spectroscopy and mechanical switch for such a deviceZEISS CARL MICROIMAGING GMBH·Filed 2010·Application pending·0 cites
- 1828US8102526B2Spectrometer with a slit for incident light and fabrication of the slitHOFMANN JENS·Filed 2008·Granted Jan 24, 2012·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →