Inventor · disambiguated record
Yukinobu Hikosaka
Also filed as: HIKOSAKA YUKINOBU
13 granted patents·314 citations·filing 1994–2006
93Inventor score
Top patents by PatentIndex Score
13 records- 0188US7518173B2Semiconductor device having ferroelectric capacitor and its manufacture methodFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Apr 14, 2009·19 cites·6 claims
- 0288US6570203B2Semiconductor device and method of manufacturing the sameFUJITSU LTD·Filed 2001·Granted May 27, 2003·42 cites·12 claims
- 0387US6509593B2Semiconductor device and method of manufacturing the sameFUJITSU LTD·Filed 2000·Granted Jan 21, 2003·50 cites·4 claims
- 0487US5779925APlasma processing with less damageFUJITSU LTD·Filed 1995·Granted Jul 14, 1998·90 cites·20 claims
- 0584US7390678B2Method for fabricating semiconductor deviceFUJITSU LTD·Filed 2005·Granted Jun 24, 2008·9 cites·17 claims
- 0683US5471115AMethod and apparatus for measuring electron density of plasmaFUJITSU LTD·Filed 1994·Granted Nov 28, 1995·42 cites·11 claims
- 0780US6706540B2Method of manufacturing a semiconductor device with a hydrogen barrier layerFUJITSU LTD·Filed 2003·Granted Mar 16, 2004·25 cites·8 claims
- 0872US7221015B2Semiconductor device and method of manufacturing the sameFUJITSU LTD·Filed 2003·Granted May 22, 2007·16 cites·9 claims
- 0962US7338815B2Semiconductor device manufacturing methodFUJITSU LTD·Filed 2005·Granted Mar 4, 2008·3 cites·17 claims
- 1062US6913970B2Semiconductor device and method of manufacturing the sameFUJITSU LTD·Filed 2002·Granted Jul 5, 2005·10 cites·15 claims
- 1153US7982466B2Inspection method for semiconductor memoryFUJITSU SEMICONDUCTOR LTD·Filed 2006·Granted Jul 19, 2011·3 cites·20 claims
- 1251US6743647B2Semiconductor memory device manufacturing methodFUJITSU LTD·Filed 2003·Granted Jun 1, 2004·3 cites·24 claims
- 1346US6710422B2Semiconductor device and method of manufacturing the sameFUJITSU LTD·Filed 2002·Granted Mar 23, 2004·2 cites·24 claims
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