Inventor · disambiguated record
Eiichi Shirakawa
Also filed as: SHIRAKAWA EIICHI
19 granted patents·5 pending applications·768 citations·filing 1990–2013
96Inventor score
Top patents by PatentIndex Score
24 records- 0193US6841342B2Substrate processing apparatus and substrate processing methodTOKYO ELECTRON LTD·Filed 2002·Granted Jan 11, 2005·61 cites·30 claims
- 0292US6474986B2Hot plate cooling method and heat processing apparatusTOKYO ELECTRON LTD·Filed 2001·Granted Nov 5, 2002·71 cites·33 claims
- 0390US6753508B2Heating apparatus and heating methodTOKYO ELECTRON LTD·Filed 2002·Granted Jun 22, 2004·53 cites·18 claims
- 0490US6222161B1Heat treatment apparatusTOKYO ELECTRON LTD·Filed 1999·Granted Apr 24, 2001·84 cites·36 claims
- 0588US6291800B1Heat treatment apparatus and substrate processing systemTOKYO ELECTRON LTD·Filed 1999·Granted Sep 18, 2001·86 cites·18 claims
- 0687US6380518B2Heat treatment apparatus and substrate processing systemTOKYO ELECTRON LTD·Filed 2001·Granted Apr 30, 2002·36 cites·11 claims
- 0786US6191394B1Heat treating apparatusTOKYO ELECTRON LTD·Filed 1999·Granted Feb 20, 2001·85 cites·35 claims
- 0885US6450803B2Heat treatment apparatusTOKYO ELECTRON LTD·Filed 2001·Granted Sep 17, 2002·26 cites·11 claims
- 0979US6229116B1Heat treatment apparatusTOKYO ELECTRON LTD·Filed 1999·Granted May 8, 2001·57 cites·16 claims
- 1078US6744020B2Heat processing apparatusTOKYO ELECTRON LTD·Filed 2001·Granted Jun 1, 2004·24 cites·33 claims
- 1178US6228171B1Heat processing apparatusTOKYO ELECTRON LTD·Filed 1999·Granted May 8, 2001·52 cites·14 claims
- 1274US6644964B2Substrate processing apparatus and substrate processing methodTOKYO ELECTRON LTD·Filed 2001·Granted Nov 11, 2003·17 cites·20 claims
- 1367USRE40052EHeat treatment apparatusTOKYO ELECTRON LTD·Filed 2003·Granted Feb 12, 2008·8 cites·36 claims
- 1467US5249142AIndirect temperature-measurement of films formed on semiconductor wafersTEL KYUSHU KK·Filed 1992·Granted Sep 28, 1993·34 cites·12 claims
- 1566US5070813ACoating apparatusTOKYO ELECTRON LTD·Filed 1990·Granted Dec 10, 1991·42 cites·8 claims
- 1660US8963964B2Computer-readable storage medium having display control program stored therein, display control method, display control system, and display control apparatusSHIRAKAWA EIICHI·Filed 2011·Granted Feb 24, 2015·1 cites·14 claims
- 1754US5225663AHeat process deviceTEL KYUSHU KK·Filed 1991·Granted Jul 6, 1993·25 cites·5 claims
- 1846US2014368450A1Information processing system, information processing apparatus, storage medium having stored therein information processing program, and information processing methodNINTENDO CO LTD·Filed 2013·Application pending·0 cites
- 1939US2012293493A1Computer-readable storage medium having display control program stored therein, display control apparatus, display control system, and display control methodKUROUME TOMOAKI·Filed 2011·Application pending·0 cites
- 2039US2012066627A1Computer-readable storage medium having stored thereon display control program, display control system, display control apparatus, and display control methodFURUKAWA SATOSHI·Filed 2011·Application pending·0 cites
- 2139US2012293492A1Information processing system, information processing apparatus, computer-readable storage medium having information processing program stored therein, and information processing methodKUROUME TOMOAKI·Filed 2011·Application pending·0 cites
- 2236US2012293494A1Computer-readable storage medium having display control program stored therein, display control apparatus, display control system, and display control methodKUROUME TOMOAKI·Filed 2011·Application pending·0 cites
- 2335US9021385B2Computer-readable storage medium having stored thereon display control program, display control system, display control apparatus, and display control methodMIZUTANI SHOHEI·Filed 2011·Granted Apr 28, 2015·0 cites·18 claims
- 2435US5038608AMethod for measuring the flow rate of exhaust gasTOKYO ELECTRON LTD·Filed 1990·Granted Aug 13, 1991·6 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →