Inventor · disambiguated record
Anil Gannepalli
Also filed as: GANNEPALLI ANIL
4 granted patents·1 pending application·21 citations·filing 2009–2017
71Inventor score
Technology areasG01Q
Top patents by PatentIndex Score
5 records- 0185US8370960B2Modular atomic force microscopeASYLUM RESEARCH CORP·Filed 2009·Granted Feb 5, 2013·14 cites·3 claims
- 0284US8677809B2Thermal measurements using multiple frequency atomic force microscopyPROKSCH ROGER·Filed 2010·Granted Mar 25, 2014·6 cites·2 claims
- 0365US9604846B2Thermal measurements using multiple frequency atomic force microscopyASYLUM RESEARCH CORP·Filed 2014·Granted Mar 28, 2017·1 cites·26 claims
- 0455US10556793B2Thermal measurements using multiple frequency atomic force microscopyASYLUM RES CORPORATION·Filed 2017·Granted Feb 11, 2020·0 cites·35 claims
- 0555US2017254834A1Modular Atomic Force MicroscopeOXFORD INSTR PLC·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →