Inventor · disambiguated record
Sang-Kyu Yoo
Also filed as: YOO SANG-KYU
3 granted patents·2 pending applications·5 citations·filing 2006–2017
54Inventor score
Top patents by PatentIndex Score
5 records- 0170US7605596B2Probe card, apparatus and method for inspecting an objectSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Oct 20, 2009·5 cites·9 claims
- 0247US10295564B2Apparatus for clamping a probe card and probe card including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted May 21, 2019·0 cites·18 claims
- 0339US7701235B2Substrate test probing equipment having forcing part for test head and force-receiving pattern for probe card and methods of using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Apr 20, 2010·0 cites·26 claims
- 0439US2006170437A1Probe card for testing a plurality of semiconductor chips and method thereofYOO SANG-KYU·Filed 2006·Application pending·0 cites
- 0539US2007035318A1Donut-type parallel probe card and method of testing semiconductor wafer using sameYOO SANG-KYU·Filed 2006·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Sang-Kyu Yoo files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →