Inventor · disambiguated record
Ofer Adan
Also filed as: ADAN OFER
10 granted patents·42 citations·filing 2011–2020
85Inventor score
Top patents by PatentIndex Score
10 records- 0194US9530199B1Technique for measuring overlay between layers of a multilayer structureAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Dec 27, 2016·12 cites·15 claims
- 0292US10354376B2Technique for measuring overlay between layers of a multilayer structureAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Jul 16, 2019·5 cites·20 claims
- 0387US10049904B1Method and system for moving a substrateAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Aug 14, 2018·6 cites·15 claims
- 0487US9046475B2High electron energy based overlay error measurement methods and systemsLANGER MOSHE·Filed 2011·Granted Jun 2, 2015·17 cites·19 claims
- 0583US9916652B2Technique for measuring overlay between layers of a multilayer structureAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Mar 13, 2018·2 cites·20 claims
- 0650US12250503B2Prediction of electrical properties of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Mar 11, 2025·0 cites·20 claims
- 0750US10957567B2Method, computer program product and system for detecting manufacturing process defectsAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Mar 23, 2021·0 cites·13 claims
- 0847US9297692B2System and method for inspecting a sample using landing lensAPPLIED MATERIALS ISRAEL LTD·Filed 2013·Granted Mar 29, 2016·0 cites·20 claims
- 0945US9835563B2Evaluation system and a method for evaluating a substrateAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Dec 5, 2017·0 cites·20 claims
- 1040US9383196B2System, method and computed readable medium for evaluating a parameter of a feature having nano-metric dimensionsAPPLIED MATERIALS ISRAEL LTD·Filed 2013·Granted Jul 5, 2016·0 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →