Inventor · disambiguated record
Katsuya Kikuchi
Also filed as: KIKUCHI KATSUYA
31 granted patents·3 pending applications·519 citations·filing 1983–2025
97Inventor score
Top patents by PatentIndex Score
34 records- 0193US4819077AColor image processing systemTOSHIBA KK·Filed 1987·Granted Apr 4, 1989·92 cites·5 claims
- 0292US7787121B2Imaging apparatusFUJIFILM CORP·Filed 2008·Granted Aug 31, 2010·17 cites·6 claims
- 0386US4947246AColor endoscope apparatus including color lighting controlTOSHIBA KK·Filed 1989·Granted Aug 7, 1990·50 cites·8 claims
- 0482US7990165B2Contact probe and method of making the sameNAT INST OF ADVANCED IND SCIEN·Filed 2007·Granted Aug 2, 2011·10 cites·4 claims
- 0578US9345145B2Electroless gold plating solution for forming fine gold structure, method of forming fine gold structure using same, and fine gold structure formed using sameIWAI RYOTA·Filed 2010·Granted May 17, 2016·3 cites·13 claims
- 0676US7323348B2Superconducting integrated circuit and method for fabrication thereofNAT INST OF ADVANCED IND SCIEN·Filed 2005·Granted Jan 29, 2008·7 cites·5 claims
- 0775US8367468B2Electrode connection structure of semiconductor chip, conductive member, and semiconductor device and method for manufacturing the sameNAT INST OF ADVANCED IND SCIEN·Filed 2011·Granted Feb 5, 2013·3 cites·11 claims
- 0873US7208966B2Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probeKIYOTA MFG CO·Filed 2005·Granted Apr 24, 2007·7 cites·7 claims
- 0972US9818645B2Through electrode, manufacturing method thereof, and semiconductor device and manufacturing method thereofAIST·Filed 2016·Granted Nov 14, 2017·2 cites·4 claims
- 1067US7227352B2Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probeKIYOTA MFG CO·Filed 2006·Granted Jun 5, 2007·5 cites·2 claims
- 1167US4823370AX-ray diagnostic apparatusTOSHIBA KK·Filed 1987·Granted Apr 18, 1989·21 cites·7 claims
- 1267US4712133AEndoscopic apparatusTOSHIBA KK·Filed 1986·Granted Dec 8, 1987·26 cites·16 claims
- 1366US5331949AEndoscope having illuminance ratio adjusting device between moving and still picture imagesTOSHIBA KK·Filed 1991·Granted Jul 26, 1994·29 cites·13 claims
- 1465US7833835B2Multi-layer fin wiring interposer fabrication processNAT INST OF ADVANCED IND SCIEN·Filed 2007·Granted Nov 16, 2010·3 cites·4 claims
- 1562US8399979B2Electrode connection structure of semiconductor chip, conductive member, and semiconductor device and method for manufacturing the sameYAMAJI YASUHIRO·Filed 2007·Granted Mar 19, 2013·3 cites·21 claims
- 1661US5099954AOil strainer device of an automatic transmissionAISIN AW CO·Filed 1990·Granted Mar 31, 1992·21 cites·5 claims
- 1760US4998973AEndoscopeTOSHIBA KK·Filed 1988·Granted Mar 12, 1991·55 cites·14 claims
- 1859US6911665B2Superconducting integrated circuit and method for fabrication thereofPI R & D CO LTD·Filed 2003·Granted Jun 28, 2005·5 cites·5 claims
- 1956US7767574B2Method of forming micro metal bumpMIKUNI KOGYO KK·Filed 2007·Granted Aug 3, 2010·2 cites·9 claims
- 2055US5045935AElectronic endoscope system including image processing unit with photographing unitTOSHIBA KK·Filed 1990·Granted Sep 3, 1991·67 cites·12 claims
- 2155US5007407AEndoscope having picture image freeze deviceTOSHIBA KK·Filed 1989·Granted Apr 16, 1991·12 cites·15 claims
- 2253US7414422B2System in-package test inspection apparatus and test inspection methodNAT INST OF ADVANCED IND SCIEN·Filed 2005·Granted Aug 19, 2008·2 cites·5 claims
- 2352US2025221321A1Structure, superconducting device, and method for manufacturing structureAIST·Filed 2025·Application pending·0 cites
- 2450US5045934AElectronic endoscope apparatus capable of indicating over-exposure area on functional imageTOSHIBA KK·Filed 1990·Granted Sep 3, 1991·12 cites·7 claims
- 2547US4618928AData processing apparatus for producing X-ray images with improved signal to noise ratioTOKYO SHIBAURA ELECTRIC CO·Filed 1983·Granted Oct 21, 1986·7 cites·4 claims
- 2643US4656650AX-ray diagnostic apparatus for eliminating scattered X-ray componentsTOSHIBA KK·Filed 1985·Granted Apr 7, 1987·25 cites·7 claims
- 2742US2005197529A1Endoscopic mouthpieceFUJINON CORP·Filed 2005·Application pending·0 cites
- 2841US9984956B2Through electrode, manufacturing method thereof, and semiconductor device and manufacturing method thereofAIST·Filed 2015·Granted May 29, 2018·0 cites·11 claims
- 2941US4741009AX-ray diagnostic apparatus for analyzing scattered X-rays by using X-ray shield memberTOSHIBA KK·Filed 1985·Granted Apr 26, 1988·13 cites·13 claims
- 3040US11270968B2Electronic circuit connection method and electronic circuitAIST·Filed 2019·Granted Mar 8, 2022·0 cites·11 claims
- 3139US9134346B2Method of making contact probeAOYAGI MASAHIRO·Filed 2011·Granted Sep 15, 2015·0 cites·15 claims
- 3239US2004256727A1Multi-layer fine wiring interposer and manufacturing method thereofFiled 2004·Application pending·0 cites
- 3337US4599742AX-ray diagnostic apparatusTOKYO SHIBAURA ELECTRIC CO·Filed 1984·Granted Jul 8, 1986·12 cites·6 claims
- 3434US4653080AX-ray diagnostic apparatusTOKYO SHIBAURA ELECTRIC CO·Filed 1984·Granted Mar 24, 1987·8 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →