Inventor · disambiguated record
Sang Han Chung
Also filed as: CHUNG SANG HAN
5 granted patents·2 pending applications·8 citations·filing 2006–2015
67Inventor score
Top patents by PatentIndex Score
7 records- 0160US7644447B2Scanning probe microscope capable of measuring samples having overhang structurePARK SYSTEMS CORP·Filed 2006·Granted Jan 5, 2010·7 cites·10 claims
- 0259US8209766B2Scanning probe microscope capable of measuring samples having overhang structurePARK SANG-IL·Filed 2010·Granted Jun 26, 2012·1 cites·14 claims
- 0348US9645168B2Head limiting movement range of laser spot and atomic force microscope having the samePARK SYSTEMS CORP·Filed 2015·Granted May 9, 2017·0 cites·10 claims
- 0439US10133052B2Image acquiring method and image acquiring apparatus using the samePARK SYSTEMS CORP·Filed 2014·Granted Nov 20, 2018·0 cites·8 claims
- 0538US2009200462A1Scanning probe microscope capable of measuring samples having overhang structurePARK SYSTEMS CORP·Filed 2009·Application pending·0 cites
- 0634US9645169B2Measurement apparatus and method with adaptive scan ratePARK SYSTEMS CORP·Filed 2015·Granted May 9, 2017·0 cites·18 claims
- 0732US2010218285A1Scanning probe microscope capable of measuring samples having overhang structurePARK SYSTEMS CORP·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →