Inventor · disambiguated record
Fumikazu Iwahana
Also filed as: IWAHANA FUMIKAZU
7 granted patents·1 pending application·255 citations·filing 2004–2009
89Inventor score
Technology areasG01R
Top patents by PatentIndex Score
8 records- 0196US7788052B2Method and device for determining state of health of the battery, and battery power supply systemFURUKAWA ELECTRIC CO LTD·Filed 2008·Granted Aug 31, 2010·41 cites·14 claims
- 0296US7626394B2Method and apparatus for determining deterioration of secondary battery, and power supply system therewithFURUKAWA ELECTRIC CO LTD·Filed 2008·Granted Dec 1, 2009·69 cites·12 claims
- 0396US7362074B2Method for determining deterioration of accumulator battery, method for measuring internal impedance of secondary battery, equipment for measuring internal impedance of secondary battery, equipment for determining deterioration of secondary battery, and power supply systemFURUKAWA ELECTRIC CO LTD·Filed 2005·Granted Apr 22, 2008·68 cites·11 claims
- 0492US7616003B2Method for determining deterioration of accumulator battery, method for measuring internal impedance of secondary battery, equipment for measuring internal impedance of secondary battery, equipment for determining deterioration of secondary battery, and power supply systemFURUKAWA ELECTRIC CO LTD·Filed 2007·Granted Nov 10, 2009·28 cites·21 claims
- 0590US8129996B2Method and apparatus for determining deterioration of secondary battery, and power supply system therewithIWANE NORIYASU·Filed 2009·Granted Mar 6, 2012·17 cites·14 claims
- 0683US8078416B2Remaining electrical charge/remaining capacity estimating method, battery state sensor and battery power source systemIWANE NORIYASU·Filed 2007·Granted Dec 13, 2011·13 cites·15 claims
- 0773US7525284B2Charging rate estimating method, charging rate estimating unit and battery systemFURUKAWA ELECTRIC CO LTD·Filed 2004·Granted Apr 28, 2009·19 cites·16 claims
- 0840US2008136378A1Method and apparatus for detecting battery state of chargeFURUKAWA ELECTRIC CO LTD·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →