Inventor · disambiguated record
Akira Tonomura
Also filed as: TONOMURA AKIRA
10 granted patents·425 citations·filing 1983–1996
92Inventor score
Top patents by PatentIndex Score
10 records- 0192US5814815APhase-contrast electron microscope and phase plate thereforHITACHI LTD·Filed 1996·Granted Sep 29, 1998·84 cites·11 claims
- 0289US5426521AAberration correction method and aberration correction apparatusJAPAN RES DEV CORP·Filed 1992·Granted Jun 20, 1995·133 cites·9 claims
- 0389US4935625AElectron holography apparatusHITACHI LTD·Filed 1988·Granted Jun 19, 1990·46 cites·9 claims
- 0486US4532422AElectron holography microscopeHITACHI LTD·Filed 1983·Granted Jul 30, 1985·29 cites·10 claims
- 0581US4998788AReflection electron holography apparatusHITACHI LTD·Filed 1990·Granted Mar 12, 1991·41 cites·8 claims
- 0677US5192867AElectron optical measurement apparatusHITACHI LTD·Filed 1991·Granted Mar 9, 1993·33 cites·5 claims
- 0769US4945247AField emission electron gun systemHITACHI LTD·Filed 1989·Granted Jul 31, 1990·15 cites·6 claims
- 0866US4748132AMicro fabrication process for semiconductor structure using coherent electron beamsHITACHI LTD·Filed 1986·Granted May 31, 1988·31 cites·26 claims
- 0961US4642461AField emission type electron microscope using a multi-stage acceleration tubeHITACHI LTD·Filed 1984·Granted Feb 10, 1987·10 cites·6 claims
- 1028US5446589AInterference device and method for observing phase informalitiesJAPAN RES DEV CORP·Filed 1993·Granted Aug 29, 1995·3 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →