Inventor · disambiguated record
Victor Katsap
Also filed as: KATSAP VICTOR
27 granted patents·1 pending application·202 citations·filing 1999–2023
95Inventor score
Files withNUFLARE TECHNOLOGY INC15AGERE SYSTEMS INC7AGERE SYST GUARDIAN CORP3LUCENT TECHNOLOGIES INC2TOSHIBA MACHINE AMERICA INC1
Top patents by PatentIndex Score
28 records- 0195US6333508B1Illumination system for electron beam lithography toolLUCENT TECHNOLOGIES INC·Filed 2000·Granted Dec 25, 2001·81 cites·40 claims
- 0293US10573481B1Electron guns for electron beam toolsNUFLARE TECHNOLOGY INC·Filed 2018·Granted Feb 25, 2020·9 cites·15 claims
- 0390US10593505B1Low temperature, high-brightness, cathodeNUFLARE TECHNOLOGY INC·Filed 2018·Granted Mar 17, 2020·5 cites·18 claims
- 0489US9790620B1Method of reducing work function in carbon coated LaB6 cathodesNUFLARE TECHNOLOGY INC·Filed 2017·Granted Oct 17, 2017·5 cites·9 claims
- 0585US9165737B2High-brightness, long life thermionic cathode and methods of its fabricationNUFLARE TECHNOLOGY INC·Filed 2012·Granted Oct 20, 2015·6 cites·15 claims
- 0681US6528799B1Device and method for suppressing space charge induced aberrations in charged-particle projection lithography systemsLUCENT TECHNOLOGIES INC·Filed 2000·Granted Mar 4, 2003·18 cites·47 claims
- 0780US12165834B2Method and apparatus for Schottky TFE inspectionNUFLARE TECHNOLOGY INC·Filed 2023·Granted Dec 10, 2024·0 cites·13 claims
- 0880US10714311B2Individual beam detector for multiple beams, multi-beam irradiation apparatus, and individual beam detection method for multiple beamsNUFLARE TECHNOLOGY INC·Filed 2018·Granted Jul 14, 2020·2 cites·12 claims
- 0979US7176610B2High brightness thermionic cathodeTOSHIBA MACHINE AMERICA INC·Filed 2004·Granted Feb 13, 2007·17 cites·25 claims
- 1077US12131883B2Method and apparatus for usable beam current and brightness in Schottky thermal field emission (TFE)NUFLARE TECHNOLOGY INC·Filed 2023·Granted Oct 29, 2024·0 cites·8 claims
- 1175US11901154B1Conical heat shield for electron emitting cathodeNUFLARE TECHNOLOGY INC·Filed 2023·Granted Feb 13, 2024·0 cites·20 claims
- 1274US6400090B2Electron emitters for lithography toolsAGERE SYST GUARDIAN CORP·Filed 2001·Granted Jun 4, 2002·14 cites·6 claims
- 1370US11640896B2Method and apparatus for Schottky TFE inspectionNUFLARE TECHNOLOGY INC·Filed 2021·Granted May 2, 2023·0 cites·10 claims
- 1468US11823862B2Method and apparatus for usable beam current and brightness in Schottky thermal field emission (TFE)NUFLARE TECHNOLOGY INC·Filed 2021·Granted Nov 21, 2023·0 cites·15 claims
- 1567US6440620B1Electron beam lithography focusing through spherical aberration introductionAGERE SYSTEMS INC·Filed 2000·Granted Aug 27, 2002·11 cites·6 claims
- 1666US11699564B2Schottky thermal field emitter with integrated beam splitterNUFLARE TECHNOLOGY INC·Filed 2020·Granted Jul 11, 2023·0 cites·20 claims
- 1758US11562879B2Low-blur electrostatic transfer lens for multi-beam electron gunNUFLARE TECHNOLOGY INC·Filed 2020·Granted Jan 24, 2023·0 cites·16 claims
- 1858US2024290594A1Method for evaluating thermionic electron emitter in situNUFLARE TECHNOLOGY INC·Filed 2023·Application pending·0 cites
- 1955US10553388B1High-brightness lanthanum hexaboride cathode and method for manufacturing of cathodeNUFLARE TECHNOLOGY INC·Filed 2018·Granted Feb 4, 2020·0 cites·3 claims
- 2054US6420714B1Electron beam imaging apparatusAGERE SYST GUARDIAN CORP·Filed 2000·Granted Jul 16, 2002·5 cites·6 claims
- 2151US11615938B2High-resolution multiple beam sourceNUFLARE TECHNOLOGY INC·Filed 2019·Granted Mar 28, 2023·0 cites·18 claims
- 2250US6232040B1Method of electron beam exposure utilizing emitter with conductive mesh gridAGERE SYSTEMS INC·Filed 1999·Granted May 15, 2001·13 cites·3 claims
- 2347US7179148B2Cathode with improved work function and method for making the sameAGERE SYSTEMS INC·Filed 2004·Granted Feb 20, 2007·0 cites·13 claims
- 2439US6620565B2Electron beam lithography apparatus focused through spherical aberration introductionAGERE SYSTEMS INC·Filed 2002·Granted Sep 16, 2003·0 cites·10 claims
- 2538US6448569B1Bonded article having improved crystalline structure and work function uniformity and method for making the sameAGERE SYST GUARDIAN CORP·Filed 1999·Granted Sep 10, 2002·6 cites·21 claims
- 2637US7345290B2Lens array for electron beam lithography toolAGERE SYSTEMS INC·Filed 1999·Granted Mar 18, 2008·6 cites·25 claims
- 2734US6492647B1Electron guns for lithography toolsAGERE SYSTEMS INC·Filed 1999·Granted Dec 10, 2002·4 cites·10 claims
- 2831US6815876B1Cathode with improved work function and method for making the sameAGERE SYSTEMS INC·Filed 1999·Granted Nov 9, 2004·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →