Inventor · disambiguated record
Kevin G. Stawiasz
Also filed as: STAWIASZ KEVIN G · STAWIASZ KEVIN GEOFFREY
8 granted patents·1 pending application·5 citations·filing 2007–2018
75Inventor score
Top patents by PatentIndex Score
9 records- 0181US9791499B2Circuit to detect previous use of computer chips using passive test wiresIBM·Filed 2015·Granted Oct 17, 2017·3 cites·11 claims
- 0276US10102090B2Non-destructive analysis to determine use history of processorIBM·Filed 2016·Granted Oct 16, 2018·2 cites·20 claims
- 0358US10552278B2Non-destructive analysis to determine use history of processorIBM·Filed 2018·Granted Feb 4, 2020·0 cites·20 claims
- 0452US11105856B2Detection of performance degradation in integrated circuitsIBM·Filed 2018·Granted Aug 31, 2021·0 cites·20 claims
- 0548US9791500B2Circuit to detect previous use of computer chips using passive test wiresIBM·Filed 2015·Granted Oct 17, 2017·0 cites·8 claims
- 0638US8587288B2Digital interface for fast, inline, statistical characterization of process, MOS device and circuit variationsBHAVNAGARWALA AZEEZ JENNUDIN·Filed 2010·Granted Nov 19, 2013·0 cites·5 claims
- 0738US2009063061A1Monitoring degradation of circiut speedIBM·Filed 2007·Application pending·0 cites
- 0836US7768848B2On-chip characterization of noise-margins for memory arraysIBM·Filed 2007·Granted Aug 3, 2010·0 cites·20 claims
- 0933US8729920B2Circuit and method for RAS-enabled and self-regulated frequency and delay sensorGRAAS CAROLE D·Filed 2010·Granted May 20, 2014·0 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →