Inventor · disambiguated record
Tsuneo Abe
Also filed as: ABE TSUNEO
15 granted patents·3 pending applications·74 citations·filing 2000–2020
91Inventor score
Top patents by PatentIndex Score
18 records- 0186US7050920B2Semiconductor device having a test circuit for testing an output circuitELPIDA MEMORY INC·Filed 2005·Granted May 23, 2006·14 cites·5 claims
- 0284US7830189B2DLL circuit and control method thereforELPIDA MEMORY INC·Filed 2009·Granted Nov 9, 2010·15 cites·20 claims
- 0378US7932759B2DLL circuit and control method thereforELPIDA MEMORY INC·Filed 2009·Granted Apr 26, 2011·10 cites·27 claims
- 0476US8565032B2Semiconductor deviceABE TSUNEO·Filed 2011·Granted Oct 22, 2013·8 cites·17 claims
- 0574US9875778B2Semiconductor device including a clock adjustment circuitMICRON TECHNOLOGY INC·Filed 2014·Granted Jan 23, 2018·3 cites·20 claims
- 0672US10181343B2Semiconductor device including a clock adjustment circuitMICRON TECHNOLOGY INC·Filed 2017·Granted Jan 15, 2019·2 cites·14 claims
- 0772US7755401B2Semiconductor device including DLL circuit, and data processing systemELPIDA MEMORY INC·Filed 2008·Granted Jul 13, 2010·8 cites·8 claims
- 0868US11120855B2Semiconductor device including a clock adjustment circuitMICRON TECHNOLOGY INC·Filed 2019·Granted Sep 14, 2021·1 cites·22 claims
- 0965US10388341B2Semiconductor device including a clock adjustment circuitMICRON TECHNOLOGY INC·Filed 2018·Granted Aug 20, 2019·1 cites·16 claims
- 1060US7449931B2Duty ratio adjustmentELPIDA MEMORY INC·Filed 2006·Granted Nov 11, 2008·2 cites·3 claims
- 1150US6999889B2Semiconductor device having a test circuit for testing an output circuitELPIDA MEMORY INC·Filed 2004·Granted Feb 14, 2006·4 cites·8 claims
- 1247US6356490B1Semiconductor device, testing device thereof and testing method thereofNEC CORP·Filed 2000·Granted Mar 12, 2002·6 cites·12 claims
- 1343US7644325B2Semiconductor integrated circuit device and method of testing the sameELPIDA MEMORY INC·Filed 2007·Granted Jan 5, 2010·0 cites·18 claims
- 1440US11555828B2Testing probe system for testing semiconductor die, multi-channel die having shared pads, and related systems and methodsMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 17, 2023·0 cites·25 claims
- 1536US7796447B2Semiconductor memory device having output impedance adjustment circuit and test method of output impedanceELPIDA MEMORY INC·Filed 2008·Granted Sep 14, 2010·0 cites·11 claims
- 1636US2010320580A1Equipotential pad connectionELPIDA MEMORY INC·Filed 2010·Application pending·0 cites
- 1733US2011248756A1Semiconductor circuitELPIDA MEMORY INC·Filed 2011·Application pending·0 cites
- 1831US2011204942A1Clock control circuit and semiconductor device including the sameELPIDA MEMORY INC·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →