Inventor · disambiguated record
Conrad A. Barile
Also filed as: BARILE CONRAD A
5 granted patents·2 pending applications·106 citations·filing 1976–2008
82Inventor score
Files withIBM7
Top patents by PatentIndex Score
7 records- 0182US6972209B2Stacked via-stud with improved reliability in copper metallurgyIBM·Filed 2002·Granted Dec 6, 2005·32 cites·8 claims
- 0280US7138714B2Via barrier layers continuous with metal line barrier layers at notched or dielectric mesa portions in metal linesIBM·Filed 2005·Granted Nov 21, 2006·10 cites·10 claims
- 0377US4243435ABipolar transistor fabrication process with an ion implanted emitterIBM·Filed 1979·Granted Jan 6, 1981·36 cites·26 claims
- 0469US8053257B2Method for prediction of premature dielectric breakdown in a semiconductorIBM·Filed 2008·Granted Nov 8, 2011·5 cites·11 claims
- 0560US4060427AMethod of forming an integrated circuit region through the combination of ion implantation and diffusion stepsIBM·Filed 1976·Granted Nov 29, 1977·23 cites·7 claims
- 0646US2006014376A1Stacked via-stud with improved reliability in copper metallurgyIBM·Filed 2005·Application pending·0 cites
- 0741US2006281338A1Method for prediction of premature dielectric breakdown in a semiconductorIBM·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →