Inventor · disambiguated record
Katsuhiro Matsuyama
Also filed as: MATSUYAMA KATSUHIRO
13 granted patents·588 citations·filing 1992–2015
94Inventor score
Top patents by PatentIndex Score
13 records- 0194US5367165ACantilever chip for scanning probe microscopeOLYMPUS OPTICAL CO·Filed 1993·Granted Nov 22, 1994·92 cites·9 claims
- 0288US5386720AIntegrated AFM sensorOLYMPUS OPTICAL CO·Filed 1994·Granted Feb 7, 1995·83 cites·21 claims
- 0386US5883387ASPM cantilever and a method for manufacturing the sameOLYMPUS OPTICAL CO·Filed 1997·Granted Mar 16, 1999·97 cites·12 claims
- 0483US9039200B2Projector and control method for projectorNOBORI TATSUHIKO·Filed 2012·Granted May 26, 2015·5 cites·16 claims
- 0582US5583286AIntegrated sensor for scanning probe microscopeOLYMPUS OPTICAL CO·Filed 1995·Granted Dec 10, 1996·75 cites·19 claims
- 0682US5319961ACantilever chip for use in scanning probe microscopeOLYMPUS OPTICAL CO·Filed 1992·Granted Jun 14, 1994·55 cites·12 claims
- 0778US5811017ACantilever for use in a scanning probe microscope and method of manufacturing the sameOLYMPUS OPTICAL CO·Filed 1996·Granted Sep 22, 1998·60 cites·14 claims
- 0868US5929643AScanning probe microscope for measuring the electrical properties of the surface of an electrically conductive sampleOLYMPUS OPTICAL CO·Filed 1996·Granted Jul 27, 1999·38 cites·15 claims
- 0967US8616707B2Projector with cooling mechanismMIYAZAWA YASUNAGA·Filed 2011·Granted Dec 31, 2013·2 cites·6 claims
- 1065US6097197AScanning probe microscopeOLYMPUS OPTICAL CO·Filed 1997·Granted Aug 1, 2000·34 cites·13 claims
- 1162US6415653B1Cantilever for use in a scanning probe microscopeOLYMPUS OPTICAL CO·Filed 1999·Granted Jul 9, 2002·27 cites·8 claims
- 1256US5753912ACantilever chipOLYMPUS OPTICAL CO·Filed 1997·Granted May 19, 1998·20 cites·8 claims
- 1350US9258538B2Projector and control method for projectorSEIKO EPSON CORP·Filed 2015·Granted Feb 9, 2016·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →