Inventor · disambiguated record
Dieter Kantz
Also filed as: KANTZ DIETER
7 granted patents·136 citations·filing 1981–2001
86Inventor score
Top patents by PatentIndex Score
7 records- 0183US4752929AMethod of operating a semiconductor memory with a capability of testing, and an evaluation circuit for performing the methodSIEMENS AG·Filed 1986·Granted Jun 21, 1988·56 cites·30 claims
- 0279US6825682B2Test configuration for the functional testing of a semiconductor chipINFINEON TECHNOLOGIES AG·Filed 2001·Granted Nov 30, 2004·24 cites·13 claims
- 0364US4737935AIntegrated write/read memorySIEMENS AG·Filed 1985·Granted Apr 12, 1988·25 cites·12 claims
- 0462US4602353AIntegrated semiconductor circuit with a dynamic read-write memorySIEMENS AG·Filed 1983·Granted Jul 22, 1986·16 cites·21 claims
- 0537US4930000ATerminal assembly for an integrated semiconductor circuitSIEMENS AG·Filed 1988·Granted May 29, 1990·9 cites·7 claims
- 0634US4454431ASemiconductor circuit with a circuit part controlled by a substrate biasSIEMENS AG·Filed 1981·Granted Jun 12, 1984·3 cites·4 claims
- 0728US4393478AMonolithically integrated semiconductor memory with dummy and charge equalization cellsSIEMENS AG·Filed 1981·Granted Jul 12, 1983·3 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →