Inventor · disambiguated record
Ching-Che Tsai
Also filed as: TSAI CHING CHE
7 granted patents·2 pending applications·26 citations·filing 2011–2015
80Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD3LIN YUE-DER2TAIWAN SEMICONDUCTOR MFG2CHUANG HAK-LAY1KUO CHENG-CHENG1
Top patents by PatentIndex Score
9 records- 0190US8703595B2N/P boundary effect reduction for metal gate transistorsCHUANG HAK-LAY·Filed 2011·Granted Apr 22, 2014·9 cites·20 claims
- 0289US9184101B2Method for removing semiconductor fins using alternating masksTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Nov 10, 2015·10 cites·20 claims
- 0382US9355209B2Revising layout design through OPC to reduce corner rounding effectTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted May 31, 2016·5 cites·20 claims
- 0466US9748107B2Method for removing semiconductor fins using alternating masksTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Aug 29, 2017·1 cites·20 claims
- 0561US8656319B2Optical proximity correction convergence controlKUO CHENG-CHENG·Filed 2012·Granted Feb 18, 2014·1 cites·20 claims
- 0657US9123694B2N/P boundary effect reduction for metal gate transistorsTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Sep 1, 2015·0 cites·19 claims
- 0754US9536867B2N/P boundary effect reduction for metal gate transistorsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Jan 3, 2017·0 cites·20 claims
- 0833US2013046154A1Ppg imaging device and ppg measuring methodLIN YUE DER·Filed 2011·Application pending·0 cites
- 0933US2013046192A1Image-based pwv measurement device and methodLIN YUE-DER·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →