Inventor · disambiguated record
Shaleen Bhabu
Also filed as: BHABU SHALEEN
12 granted patents·81 citations·filing 2007–2012
91Inventor score
Files withTHIRUNAVUKARASU SENTHIL ARASU6CADENCE DESIGN SYSTEMS INC4CHAKRAVARTHY SAMEER H1DEV NILABHA1
Top patents by PatentIndex Score
12 records- 0193US7877715B1Method and apparatus to use physical design information to detect IR drop prone test patternsCADENCE DESIGN SYSTEMS INC·Filed 2008·Granted Jan 25, 2011·18 cites·7 claims
- 0291US8429593B1Method and apparatus to use physical design information to detect IR drop prone test patternsTHIRUNAVUKARASU SENTHIL ARASU·Filed 2012·Granted Apr 23, 2013·7 cites·4 claims
- 0388US8595681B1Method and apparatus to use physical design information to detect IR drop prone test patternsCADENCE DESIGN SYSTEMS INC·Filed 2012·Granted Nov 26, 2013·4 cites·6 claims
- 0488US8336019B1Method and apparatus to use physical design information to detect IR drop prone test patternsTHIRUNAVUKARASU SENTHIL ARASU·Filed 2011·Granted Dec 18, 2012·5 cites·14 claims
- 0585US8286123B1Method and apparatus to use physical design information to detect IR drop prone test patternsTHIRUNAVUKARASU SENTHIL ARASU·Filed 2011·Granted Oct 9, 2012·4 cites·16 claims
- 0681US7886263B1Testing to prescribe state capture by, and state retrieval from scan registersCADENCE DESIGN SYSTEMS INC·Filed 2007·Granted Feb 8, 2011·9 cites·19 claims
- 0779US8438528B1Method and apparatus to use physical design information to detect IR drop prone test patternsTHIRUNAVUKARASU SENTHIL ARASU·Filed 2012·Granted May 7, 2013·2 cites·3 claims
- 0877US8392868B1Method and apparatus to use physical design information to detect IR drop prone test patternsTHIRUNAVUKARASU SENTHIL ARASU·Filed 2011·Granted Mar 5, 2013·2 cites·16 claims
- 0973US7944285B1Method and apparatus to detect manufacturing faults in power switchesCADENCE DESIGN SYSTEMS INC·Filed 2008·Granted May 17, 2011·10 cites·10 claims
- 1072US8719651B1Scan chain diagnostic using scan stitchingDEV NILABHA·Filed 2011·Granted May 6, 2014·10 cites·22 claims
- 1171US8584074B1Testing to prescribe state capture by, and state retrieval from scan registersTHIRUNAVUKARASU SENTHIL ARASU·Filed 2011·Granted Nov 12, 2013·2 cites·20 claims
- 1267US8190953B2Method and system for selecting test vectors in statistical volume diagnosis using failed test dataCHAKRAVARTHY SAMEER H·Filed 2008·Granted May 29, 2012·8 cites·30 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →