Inventor · disambiguated record
Senthil Arasu Thirunavukarasu
Also filed as: THIRUNAVUKARASU SENTHIL ARASU
13 granted patents·79 citations·filing 2005–2012
92Inventor score
Top patents by PatentIndex Score
13 records- 0193US7877715B1Method and apparatus to use physical design information to detect IR drop prone test patternsCADENCE DESIGN SYSTEMS INC·Filed 2008·Granted Jan 25, 2011·18 cites·7 claims
- 0291US8429593B1Method and apparatus to use physical design information to detect IR drop prone test patternsTHIRUNAVUKARASU SENTHIL ARASU·Filed 2012·Granted Apr 23, 2013·7 cites·4 claims
- 0388US8595681B1Method and apparatus to use physical design information to detect IR drop prone test patternsCADENCE DESIGN SYSTEMS INC·Filed 2012·Granted Nov 26, 2013·4 cites·6 claims
- 0488US8336019B1Method and apparatus to use physical design information to detect IR drop prone test patternsTHIRUNAVUKARASU SENTHIL ARASU·Filed 2011·Granted Dec 18, 2012·5 cites·14 claims
- 0585US8286123B1Method and apparatus to use physical design information to detect IR drop prone test patternsTHIRUNAVUKARASU SENTHIL ARASU·Filed 2011·Granted Oct 9, 2012·4 cites·16 claims
- 0681US7886263B1Testing to prescribe state capture by, and state retrieval from scan registersCADENCE DESIGN SYSTEMS INC·Filed 2007·Granted Feb 8, 2011·9 cites·19 claims
- 0780US7277803B2Efficient calculation of a number of transitions and estimation of power dissipation in sequential scan testsTEXAS INSTRUMENTS INC·Filed 2006·Granted Oct 2, 2007·11 cites·13 claims
- 0879US8438528B1Method and apparatus to use physical design information to detect IR drop prone test patternsTHIRUNAVUKARASU SENTHIL ARASU·Filed 2012·Granted May 7, 2013·2 cites·3 claims
- 0977US8392868B1Method and apparatus to use physical design information to detect IR drop prone test patternsTHIRUNAVUKARASU SENTHIL ARASU·Filed 2011·Granted Mar 5, 2013·2 cites·16 claims
- 1073US7944285B1Method and apparatus to detect manufacturing faults in power switchesCADENCE DESIGN SYSTEMS INC·Filed 2008·Granted May 17, 2011·10 cites·10 claims
- 1171US8584074B1Testing to prescribe state capture by, and state retrieval from scan registersTHIRUNAVUKARASU SENTHIL ARASU·Filed 2011·Granted Nov 12, 2013·2 cites·20 claims
- 1259US7555687B2Sequential scan technique for testing integrated circuits with reduced power, time and/or costTEXAS INSTRUMENTS INC·Filed 2005·Granted Jun 30, 2009·3 cites·8 claims
- 1349US7596773B2Automating optimal placement of macro-blocks in the design of an integrated circuitTEXAS INSTRUMENTS INC·Filed 2006·Granted Sep 29, 2009·2 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →