Inventor · disambiguated record
Shuji Takada
Also filed as: TAKADA SHUJI
11 granted patents·2 pending applications·48 citations·filing 1999–2017
87Inventor score
Top patents by PatentIndex Score
13 records- 0183US9857483B2Radiation detector and radiation detection apparatusHORIBA LTD·Filed 2016·Granted Jan 2, 2018·3 cites·4 claims
- 0278US9740541B2Information processing apparatus and method of collecting performance analysis dataFUJITSU LTD·Filed 2015·Granted Aug 22, 2017·3 cites·14 claims
- 0372US8302459B2Thermal conductivity sensorMATSUHAMA MAKOTO·Filed 2010·Granted Nov 6, 2012·4 cites·2 claims
- 0469US8859985B2Radiation detector, radiation detection apparatus, and X-ray analyzerHORIBA LTD·Filed 2013·Granted Oct 14, 2014·1 cites·7 claims
- 0557US10132941B2Radiation detector and radiation detection apparatusHORIBA LTD·Filed 2017·Granted Nov 20, 2018·0 cites·3 claims
- 0655US6777683B2Optical detectorHORIBA LTD·Filed 2002·Granted Aug 17, 2004·1 cites·18 claims
- 0750US6425287B1Microflow sensor element and manufacturing method thereofHORIBA LTD·Filed 1999·Granted Jul 30, 2002·16 cites·3 claims
- 0848US6320192B1Detector for use in infrared analyzer, flow detector and manufacturing method thereofHORIBA LTD·Filed 1999·Granted Nov 20, 2001·12 cites·12 claims
- 0946US9619361B2Performance profiling apparatus and performance profiling methodFUJITSU LTD·Filed 2013·Granted Apr 11, 2017·0 cites·14 claims
- 1045US9262122B2Arithmetic processing apparatus and control method of arithmetic processing apparatusFUJITSU LTD·Filed 2014·Granted Feb 16, 2016·0 cites·3 claims
- 1145US2014297963A1Processing deviceFUJITSU LTD·Filed 2014·Application pending·0 cites
- 1245US2014337584A1Control apparatus, analysis apparatus, analysis method, and computer productFUJITSU LTD·Filed 2014·Application pending·0 cites
- 1335US6850520B1ATM layer cell processing apparatusFUJITSU LTD·Filed 1999·Granted Feb 1, 2005·8 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →