Inventor · disambiguated record
Markus Gerardus Martinus Maria Van Kraaij
Also filed as: VAN KRAAIJ MARKUS GERARDUS MARTINUS · VAN KRAAIJ MARKUS GERARDUS MARTINUS MARIA
37 granted patents·14 pending applications·267 citations·filing 2005–2024
97Inventor score
Top patents by PatentIndex Score
51 records- 0198US8760662B2Method and apparatus for angular-resolved spectroscopic lithography characterizationASML NETHERLANDS BV·Filed 2013·Granted Jun 24, 2014·16 cites·7 claims
- 0298US7791732B2Method and apparatus for angular-resolved spectroscopic lithography characterizationASML NETHERLANDS BV·Filed 2005·Granted Sep 7, 2010·80 cites·15 claims
- 0397US8054467B2Method and apparatus for angular-resolved spectroscopic lithography characterizationASML NETHERLANDS BV·Filed 2010·Granted Nov 8, 2011·15 cites·13 claims
- 0497US7791724B2Characterization of transmission losses in an optical systemASML NETHERLANDS BV·Filed 2006·Granted Sep 7, 2010·59 cites·21 claims
- 0595US10146140B2Methods and apparatus for simulating interaction of radiation with structures, metrology methods and apparatus, device manufacturing methodASML NETHERLANDS BV·Filed 2016·Granted Dec 4, 2018·8 cites·13 claims
- 0695US9958791B2Inspection apparatus and methods, substrates having metrology targets, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2014·Granted May 1, 2018·8 cites·16 claims
- 0794US11119414B2Yield estimation and controlASML NETHERLANDS BV·Filed 2020·Granted Sep 14, 2021·5 cites·21 claims
- 0893US8553230B2Method and apparatus for angular-resolved spectroscopic lithography characterizationDEN BOEF ARIE JEFFREY MARIA·Filed 2011·Granted Oct 8, 2013·10 cites·8 claims
- 0992US10955353B2Method and apparatus for angular-resolved spectroscopic lithography characterizationASML NETHERLANDS BV·Filed 2019·Granted Mar 23, 2021·2 cites·7 claims
- 1092US10761432B2Inspection apparatus and methods, substrates having metrology targets, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2018·Granted Sep 1, 2020·3 cites·13 claims
- 1192US9910366B2Metrology method and apparatus, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2014·Granted Mar 6, 2018·9 cites·20 claims
- 1290US11143970B2Method and apparatus for image analysisASML NETHERLANDS BV·Filed 2020·Granted Oct 12, 2021·2 cites·23 claims
- 1390US10241055B2Method and apparatus for angular-resolved spectroscopic lithography characterizationASML NETHERLANDS BV·Filed 2014·Granted Mar 26, 2019·3 cites·11 claims
- 1489US10732513B2Method and apparatus for image analysisASML NETHERLANDS BV·Filed 2019·Granted Aug 4, 2020·4 cites·20 claims
- 1589US10627723B2Yield estimation and controlASML NETHERLANDS BV·Filed 2014·Granted Apr 21, 2020·11 cites·26 claims
- 1689US10437157B2Method and apparatus for image analysisASML NETHERLANDS BV·Filed 2015·Granted Oct 8, 2019·5 cites·20 claims
- 1787US10983445B2Method and apparatus for measuring a parameter of interest using image plane detection techniquesASML NETHERLANDS BV·Filed 2019·Granted Apr 20, 2021·3 cites·20 claims
- 1887US8645109B2Methods and apparatus for determining electromagnetic scattering properties and structural parameters of periodic structuresDIRKS REMCO·Filed 2010·Granted Feb 4, 2014·9 cites·17 claims
- 1986US10795269B2Method of determining a value of a parameter of interest, method of cleaning a signal containing information about a parameter of interest, device manufacturing methodASML NETHERLANDS BV·Filed 2018·Granted Oct 6, 2020·3 cites·15 claims
- 2083US10126662B2Metrology method and apparatus, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2018·Granted Nov 13, 2018·2 cites·12 claims
- 2180US12326407B2Inspection apparatus and inspection methodASML NETHERLANDS BV·Filed 2023·Granted Jun 10, 2025·0 cites·20 claims
- 2280US11041816B2Methods and apparatus for calculating electromagnetic scattering properties of a structure and for reconstruction of approximate structuresASML NETHERLANDS BV·Filed 2017·Granted Jun 22, 2021·2 cites·20 claims
- 2379US11720029B2Method and apparatus for image analysisASML NETHERLANDS BV·Filed 2021·Granted Aug 8, 2023·0 cites·20 claims
- 2479US10649345B2Methods and apparatuses for measurement of a parameter of a feature fabricated on a substrateASML NETHERLANDS BV·Filed 2018·Granted May 12, 2020·1 cites·20 claims
- 2578US12271114B2Method and apparatus for predicting substrate imageASML NETHERLANDS BV·Filed 2020·Granted Apr 8, 2025·1 cites·20 claims
- 2678US11525786B2Method and apparatus for angular-resolved spectroscopic lithography characterizationASML NETHERLANDS BV·Filed 2021·Granted Dec 13, 2022·0 cites·4 claims
- 2778US10331041B2Metrology method and apparatus, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2018·Granted Jun 25, 2019·1 cites·12 claims
- 2877US11067901B2Method and apparatus for image analysisASML NETHERLANDS BV·Filed 2017·Granted Jul 20, 2021·1 cites·20 claims
- 2975US12493247B2Method and system for predicting process information with a parameterized modelASML NETHERLANDS BV·Filed 2020·Granted Dec 9, 2025·1 cites·13 claims
- 3075US10607334B2Method and apparatus for image analysisASML NETHERLANDS BV·Filed 2015·Granted Mar 31, 2020·2 cites·20 claims
- 3172US11022900B2Inspection apparatus and methods, substrates having metrology targets, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2020·Granted Jun 1, 2021·0 cites·20 claims
- 3268US11692948B2Inspection apparatus and inspection methodASML NETHERLANDS BV·Filed 2019·Granted Jul 4, 2023·0 cites·20 claims
- 3368US10592618B2Methods and apparatus for simulating interaction of radiation with structures, metrology methods and apparatus, device manufacturing methodASML NETHERLANDS BV·Filed 2016·Granted Mar 17, 2020·1 cites·20 claims
- 3468US2021405545A1Yield estimation and controlASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 3565US10725386B2Metrology method and apparatus, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2019·Granted Jul 28, 2020·0 cites·20 claims
- 3660US11429763B2Methods and apparatus for simulating interaction of radiation with structures, metrology methods and apparatus, device manufacturing methodASML NETHERLANDS BV·Filed 2020·Granted Aug 30, 2022·0 cites·20 claims
- 3760US2024233305A1Aligning a distorted imageASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 3859US2025284191A1Deep learning models for determining mask designs associated with semiconductor manufacturingASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 3958US2025299293A1Obtaining high resolution information from low resolution imagesASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 4058US2024118625A1Metrology target simulationASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 4157US2025355365A1Inference model trainingASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 4256US11347151B2Methods and apparatus for calculating electromagnetic scattering properties of a structureASML NETHERLANDS BV·Filed 2019·Granted May 31, 2022·0 cites·15 claims
- 4355US11982946B2Metrology targetsASML NETHERLANDS BV·Filed 2020·Granted May 14, 2024·0 cites·20 claims
- 4455US2025305882A1Method and apparatuses for fourier transform spectrometryASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 4555US2024369944A1Method for determining a stochastic metric relating to a lithographic processASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 4654US2023267711A1Apparatus and method for selecting informative patterns for training machine learning modelsASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 4754US2025231498A1Imaging method and metrology deviceASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 4853US2024320528A1Metrology target optimizationASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 4953US2021286270A1Method for decreasing uncertainty in machine learning model predictionsASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 5051US2024152060A1Method and system for predicting process information with a parameterized modelASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
Showing the top 50 of 51 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →