Inventor · disambiguated record
Adrianus Cornelis Matheus Koopman
Also filed as: KOOPMAN ADRIANUS CORNELIS · KOOPMAN ADRIANUS CORNELIS MATHEUS
23 granted patents·7 pending applications·97 citations·filing 2014–2025
95Inventor score
Files withASML NETHERLANDS BV26CYGNUS AI INC1CYGNUS AL INC1DELINEO DIAGNOSTICS INC1MIDDLEBROOKS SCOTT ANDERSON1
Top patents by PatentIndex Score
30 records- 0197US11940740B2Methods and apparatus for obtaining diagnostic information relating to an industrial processASML NETHERLANDS BV·Filed 2022·Granted Mar 26, 2024·2 cites·20 claims
- 0297US10642162B2Methods and apparatus for obtaining diagnostic information relating to an industrial processASML NETHERLANDS BV·Filed 2019·Granted May 5, 2020·8 cites·23 claims
- 0397US9946165B2Methods and apparatus for obtaining diagnostic information relating to an industrial processASML NETHERLANDS BV·Filed 2014·Granted Apr 17, 2018·19 cites·20 claims
- 0496US10274834B2Methods and apparatus for obtaining diagnostic information relating to an industrial processASML NETHERLANDS BV·Filed 2018·Granted Apr 30, 2019·15 cites·20 claims
- 0594US11119414B2Yield estimation and controlASML NETHERLANDS BV·Filed 2020·Granted Sep 14, 2021·5 cites·21 claims
- 0691US10890540B2Object identification and comparisonASML NETHERLANDS BV·Filed 2018·Granted Jan 12, 2021·4 cites·20 claims
- 0790US11143970B2Method and apparatus for image analysisASML NETHERLANDS BV·Filed 2020·Granted Oct 12, 2021·2 cites·23 claims
- 0889US11379970B2Deep learning for semantic segmentation of patternASML NETHERLANDS BV·Filed 2019·Granted Jul 5, 2022·8 cites·20 claims
- 0989US10732513B2Method and apparatus for image analysisASML NETHERLANDS BV·Filed 2019·Granted Aug 4, 2020·4 cites·20 claims
- 1089US10627723B2Yield estimation and controlASML NETHERLANDS BV·Filed 2014·Granted Apr 21, 2020·11 cites·26 claims
- 1189US10437157B2Method and apparatus for image analysisASML NETHERLANDS BV·Filed 2015·Granted Oct 8, 2019·5 cites·20 claims
- 1287US12287584B2Methods and apparatus for obtaining diagnostic information relating to an industrial processASML NETHERLANDS BV·Filed 2023·Granted Apr 29, 2025·0 cites·20 claims
- 1387US11847570B2Deep learning for semantic segmentation of patternASML NETHERLANDS BV·Filed 2022·Granted Dec 19, 2023·1 cites·20 claims
- 1485US2025264813A1Methods and apparatus for obtaining diagnostic information relating to an industrial processASML NETHERLANDS BV·Filed 2025·Application pending·0 cites
- 1584US10706534B2Method and apparatus for classifying a data point in imaging dataMIDDLEBROOKS SCOTT ANDERSON·Filed 2017·Granted Jul 7, 2020·7 cites·13 claims
- 1679US11720029B2Method and apparatus for image analysisASML NETHERLANDS BV·Filed 2021·Granted Aug 8, 2023·0 cites·20 claims
- 1778US12271114B2Method and apparatus for predicting substrate imageASML NETHERLANDS BV·Filed 2020·Granted Apr 8, 2025·1 cites·20 claims
- 1877US11067901B2Method and apparatus for image analysisASML NETHERLANDS BV·Filed 2017·Granted Jul 20, 2021·1 cites·20 claims
- 1976US11442368B2Inspection tool, inspection method and computer program productASML NETHERLANDS BV·Filed 2019·Granted Sep 13, 2022·1 cites·20 claims
- 2075US10607334B2Method and apparatus for image analysisASML NETHERLANDS BV·Filed 2015·Granted Mar 31, 2020·2 cites·20 claims
- 2175US2024412067A1Metrology Apparatus And Method For Determining A Characteristic Of One Or More Structures On A SubstrateASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 2274US11385550B2Methods and apparatus for obtaining diagnostic information relating to an industrial processASML NETHERLANDS BV·Filed 2020·Granted Jul 12, 2022·0 cites·20 claims
- 2370US10539882B2Methods and apparatus for obtaining diagnostic information, methods and apparatus for controlling an industrial processASML NETHERLANDS BV·Filed 2017·Granted Jan 21, 2020·1 cites·20 claims
- 2468US2021405545A1Yield estimation and controlASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 2554US12112260B2Metrology apparatus and method for determining a characteristic of one or more structures on a substrateASML NETHERLANDS BV·Filed 2019·Granted Oct 8, 2024·0 cites·19 claims
- 2654US11016397B2Source separation from metrology dataASML NETHERLANDS BV·Filed 2016·Granted May 25, 2021·0 cites·20 claims
- 2748US2021174491A1Hidden defect detection and epe estimation based on the extracted 3d information from e-beam imagesASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 2847US2022076829A1Method and apparatus for analyzing medical image data in a latent space representationDELINEO DIAGNOSTICS INC·Filed 2020·Application pending·0 cites
- 2946US2023138787A1Method and apparatus for processing medical image dataCYGNUS AL INC·Filed 2021·Application pending·0 cites
- 3042US2022351000A1Method and apparatus for classifying nodules in medical image dataCYGNUS AI INC·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →