Inventor · disambiguated record
Hiromitsu Takase
Also filed as: TAKASE HIROMITSU
10 granted patents·4 pending applications·168 citations·filing 1999–2012
89Inventor score
Top patents by PatentIndex Score
14 records- 0197US6632113B1Image display apparatus, disassembly processing method therefor, and component recovery methodCANON KK·Filed 2000·Granted Oct 14, 2003·100 cites·21 claims
- 0292US7416462B2Glass substrate processing method and material removal process using x-ray fluorescenceCANON KK·Filed 2005·Granted Aug 26, 2008·13 cites·10 claims
- 0383US8921807B2In situ cleaning device for lithographic apparatusTAKASE HIROMITSU·Filed 2012·Granted Dec 30, 2014·9 cites·6 claims
- 0475US6951494B2Spacer recovery method and apparatus used during disassembling of an image display apparatusCANON KK·Filed 2003·Granted Oct 4, 2005·8 cites·9 claims
- 0574US6366014B1Charge-up suppressing member, charge-up suppressing film, electron beam apparatus, and image forming apparatusCANON KK·Filed 1999·Granted Apr 2, 2002·25 cites·16 claims
- 0672US8149378B2Cleaning apparatus for exposure apparatus and exposure apparatusMORISHIMA HIDEKI·Filed 2008·Granted Apr 3, 2012·6 cites·15 claims
- 0767US2009093373A1Dna micro-array having standard probe and kit including the arrayCANON KK·Filed 2008·Application pending·0 cites
- 0865US7188031B1Method for acquiring information of a biochip using time of flight secondary ion mass spectrometry and an apparatus for acquiring information for the application thereofCANON KK·Filed 2003·Granted Mar 6, 2007·6 cites·16 claims
- 0964US8698095B2Charged particle beam drawing apparatus and article manufacturing methodTANAKA ICHIRO·Filed 2012·Granted Apr 15, 2014·1 cites·8 claims
- 1062US2004132080A1DNA micro-array having standard probe and kit including the arrayCANON KK·Filed 2003·Application pending·0 cites
- 1154US2004259088A1Method for analyzing RNA using time of flight secondary ion mass spectrometryCANON KK·Filed 2003·Application pending·0 cites
- 1248US7208276B2Probe carrier and method for analyzing the probe carrierCANON KK·Filed 2003·Granted Apr 24, 2007·0 cites·16 claims
- 1346US7724348B2Exposure apparatus and method, and device manufacturing methodCANON KK·Filed 2006·Granted May 25, 2010·0 cites·18 claims
- 1446US2004137491A1Method of analyzing probe carrier using time-of-flight secondary ion mass spectrometryFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →