Inventor · disambiguated record
Hans Manhaeve
Also filed as: MANHAEVE HANS · MANHAEVE HANS A R
9 granted patents·111 citations·filing 1997–2016
87Inventor score
Top patents by PatentIndex Score
9 records- 0177US6496028B1Method and apparatus for testing electronic devicesIMEC INTER UNI MICRO ELECTR·Filed 2000·Granted Dec 17, 2002·31 cites·27 claims
- 0277US6118293AHigh resolution (quiescent) supply current system (IDD monitor)IMEC INTER UNI MICRO ELECTR·Filed 1997·Granted Sep 12, 2000·42 cites·13 claims
- 0371US10082535B2Programmable test structure for characterization of integrated circuit fabrication processesRIDGETOP GROUP INC·Filed 2016·Granted Sep 25, 2018·2 cites·26 claims
- 0465US6441633B1High resolution (quiescent) supply current system (IDD monitor)IMEC INTER UNI MICRO ELECTR·Filed 2000·Granted Aug 27, 2002·12 cites·8 claims
- 0561US6531885B1Method and apparatus for testing supply connectionsIMEC INTER UNI MICRO ELECTR·Filed 2000·Granted Mar 11, 2003·11 cites·20 claims
- 0652US6859058B2Method and apparatus for testing electronic devicesIMEC INTER UNI MICRO ELECTR·Filed 2002·Granted Feb 22, 2005·7 cites·10 claims
- 0750US7315180B2Device for monitoring quiescent current of an electronic deviceSTAR TEST N V Q·Filed 2005·Granted Jan 1, 2008·2 cites·10 claims
- 0844US6927592B2Device for monitoring quiescent current of an electronic deviceSTAR TEST N V Q·Filed 2003·Granted Aug 9, 2005·4 cites·9 claims
- 0930US7315974B2Method for detecting faults in electronic devices, based on quiescent current measurementsSTAR TEST N V Q·Filed 2003·Granted Jan 1, 2008·0 cites·7 claims
Join the waitlist — get patent alerts
Get an alert when Hans Manhaeve files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →