Inventor · disambiguated record
Steven P. Reeves
Also filed as: REEVES STEVEN P
6 granted patents·54 citations·filing 2002–2005
81Inventor score
Files withADVANCED MICRO DEVICES INC6
Top patents by PatentIndex Score
6 records- 0178US6660543B1Method of measuring implant profiles using scatterometric techniques wherein dispersion coefficients are varied based upon depthADVANCED MICRO DEVICES INC·Filed 2002·Granted Dec 9, 2003·22 cites·52 claims
- 0267US6933158B1Method of monitoring anneal processes using scatterometry, and system for performing sameADVANCED MICRO DEVICES INC·Filed 2002·Granted Aug 23, 2005·11 cites·84 claims
- 0365US6927080B1Structures for analyzing electromigration, and methods of using sameADVANCED MICRO DEVICES INC·Filed 2002·Granted Aug 9, 2005·10 cites·65 claims
- 0461US6785009B1Method of using high yielding spectra scatterometry measurements to control semiconductor manufacturing processes, and systems for accomplishing sameADVANCED MICRO DEVICES INC·Filed 2002·Granted Aug 31, 2004·8 cites·25 claims
- 0559US6881594B1Method of using scatterometry for analysis of electromigration, and structures for performing sameADVANCED MICRO DEVICES INC·Filed 2002·Granted Apr 19, 2005·2 cites·54 claims
- 0655US7236848B2Data representation relating to a non-sampled workpieceADVANCED MICRO DEVICES INC·Filed 2005·Granted Jun 26, 2007·1 cites·32 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →