Inventor · disambiguated record
Sunil N. Shabde
Also filed as: SHABDE SUNIL · SHABDE SUNIL N · SHABDE SUNIL NARAYAN
13 granted patents·162 citations·filing 1997–2000
92Inventor score
Files withADVANCED MICRO DEVICES INC13
Top patents by PatentIndex Score
13 records- 0178US6348356B1Method and apparatus for determining the robustness of memory cells to alpha-particle/cosmic ray induced soft errorsADVANCED MICRO DEVICES INC·Filed 2000·Granted Feb 19, 2002·23 cites·12 claims
- 0267US6216099B1Test system and methodology to improve stacked NAND gate based critical path performance and reliabilityADVANCED MICRO DEVICES INC·Filed 1997·Granted Apr 10, 2001·29 cites·12 claims
- 0360US6023327ASystem and method for detecting defects in an interlayer dielectric of a semiconductor deviceADVANCED MICRO DEVICES INC·Filed 1998·Granted Feb 8, 2000·23 cites·29 claims
- 0459US6147507ASystem and method of mapping leakage current and a defect profile of a semiconductor dielectric layerADVANCED MICRO DEVICES INC·Filed 1998·Granted Nov 14, 2000·20 cites·21 claims
- 0556US6407558B2Method of determining the doping concentration across a surface of a semiconductor materialADVANCED MICRO DEVICES INC·Filed 2000·Granted Jun 18, 2002·4 cites·6 claims
- 0655US6211692B1Method and apparatus for determining the robustness and incident angle sensitivity of memory cells to alpha-particle/cosmic ray induced soft errorsADVANCED MICRO DEVICES INC·Filed 1998·Granted Apr 3, 2001·15 cites·20 claims
- 0751US5999465AMethod and apparatus for determining the robustness of memory cells to alpha-particle/cosmic ray induced soft errorsADVANCED MICRO DEVICES INC·Filed 1998·Granted Dec 7, 1999·12 cites·20 claims
- 0847US6204516B1Method and apparatus for determining the robustness of memory cells to alpha-particle/cosmic ray induced soft errorsADVANCED MICRO DEVICES INC·Filed 1998·Granted Mar 20, 2001·9 cites·7 claims
- 0945US5982691AMethod and apparatus for determining the robustness of memory cells to induced soft errors using equivalent diodesADVANCED MICRO DEVICES INC·Filed 1998·Granted Nov 9, 1999·9 cites·21 claims
- 1042US6177802B1System and method for detecting defects in an interlayer dielectric of a semiconductor device using the hall-effectADVANCED MICRO DEVICES INC·Filed 1998·Granted Jan 23, 2001·9 cites·29 claims
- 1134US6320403B1Method of determining the doping concentration and defect profile across a surface of a processed semiconductor materialADVANCED MICRO DEVICES INC·Filed 1998·Granted Nov 20, 2001·4 cites·15 claims
- 1234US6208154B1Method of determining the doping concentration across a surface of a semiconductor materialADVANCED MICRO DEVICES INC·Filed 1998·Granted Mar 27, 2001·3 cites·13 claims
- 1328US6242924B1Method for electronically measuring size of internal void in electrically conductive leadADVANCED MICRO DEVICES INC·Filed 1999·Granted Jun 5, 2001·2 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →