Inventor · disambiguated record
Hehching Harry Li
Also filed as: LI HEHCHING H · LI HEHCHING HARRY
12 granted patents·772 citations·filing 1988–2004
94Inventor score
Top patents by PatentIndex Score
12 records- 0191US4888773ASmart memory card architecture and interfaceIBM·Filed 1988·Granted Dec 19, 1989·198 cites·11 claims
- 0288US6161208AStorage subsystem including an error correcting cache and means for performing memory to memory transfersIBM·Filed 1999·Granted Dec 12, 2000·154 cites·2 claims
- 0383US6023778AMethod and apparatus for utilizing mux scan flip-flops to test speed related defects by delaying an active to inactive transition of a scan mode signalINTEL CORP·Filed 1997·Granted Feb 8, 2000·55 cites·12 claims
- 0482US5121500APreliminary polling for identification and location of removable/replaceable computer components prior to power-upIBM·Filed 1991·Granted Jun 9, 1992·123 cites·4 claims
- 0578US5822596AControlling power up using clock gatingIBM·Filed 1995·Granted Oct 13, 1998·35 cites·15 claims
- 0675US5613157AAddress range extension for a modular computerIBM·Filed 1996·Granted Mar 18, 1997·80 cites·13 claims
- 0768US5917356AThree state phase detectorIBM·Filed 1995·Granted Jun 29, 1999·58 cites·13 claims
- 0857US6754867B2Method of determining non-accessible device I/O pin speed using on chip LFSR and MISR as data source and results analyzer respectivelyINTEL CORP·Filed 2000·Granted Jun 22, 2004·11 cites·20 claims
- 0956US5581699ASystem and method for testing a clock signalIBM·Filed 1995·Granted Dec 3, 1996·17 cites·4 claims
- 1055US5619158AHierarchical clocking system using adaptive feedbackIBM·Filed 1995·Granted Apr 8, 1997·33 cites·8 claims
- 1141US6311295B1System and method for testing a clock signalIBM·Filed 1996·Granted Oct 30, 2001·8 cites·20 claims
- 1226US7437531B2Testing memoriesINTEL CORP·Filed 2004·Granted Oct 14, 2008·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →