Inventor · disambiguated record
Erich Plies
Also filed as: PLIES ERICH
22 granted patents·527 citations·filing 1981–2001
96Inventor score
Top patents by PatentIndex Score
22 records- 0191US4785176AElectrostatic-magnetic lens for particle beam apparatusSIEMENS AG·Filed 1987·Granted Nov 15, 1988·48 cites·16 claims
- 0288US4514638AElectron-optical system with variable-shaped beam for generating and measuring microstructuresSIEMENS AG·Filed 1984·Granted Apr 30, 1985·31 cites·17 claims
- 0386US4684808AScanning system for a particle beam scanning apparatusSIEMENS AG·Filed 1985·Granted Aug 4, 1987·51 cites·16 claims
- 0485US4728790ALow-abberation spectrometer objective with high secondary electron acceptanceSIEMENS AG·Filed 1987·Granted Mar 1, 1988·34 cites·12 claims
- 0585US4540885ASpectrometer objective having parallel objective fields and spectrometer fields for the potential measuring techniqueSIEMENS AG·Filed 1983·Granted Sep 10, 1985·28 cites·11 claims
- 0682US5146090AParticle beam apparatus having an immersion lens arranged in an intermediate image of the beamSIEMENS AG·Filed 1991·Granted Sep 8, 1992·39 cites·19 claims
- 0782US4551625ASpectrometer objective for particle beam measurement techniqueSIEMENS AG·Filed 1983·Granted Nov 5, 1985·22 cites·10 claims
- 0881US4769543ASpectrometer lens for particle beam apparatusSIEMENS AG·Filed 1987·Granted Sep 6, 1988·27 cites·21 claims
- 0979US4963823AElectron beam measuring instrumentSIEMENS AG·Filed 1989·Granted Oct 16, 1990·24 cites·28 claims
- 1078US4439685ACorpuscular beam blanking systemSIEMENS AG·Filed 1981·Granted Mar 27, 1984·18 cites·7 claims
- 1175US6580073B2Monochromator for charged particlesLEO ELEKTRONENMIKROSKOPIE GMB·Filed 2001·Granted Jun 17, 2003·19 cites·13 claims
- 1275US5661400AAntenna for nuclear magnetic resonance tomographySIEMENS AG·Filed 1996·Granted Aug 26, 1997·45 cites·9 claims
- 1375US5247392AObjective lens for producing a radiation focus in the inside of a specimenSIEMENS AG·Filed 1992·Granted Sep 21, 1993·41 cites·18 claims
- 1474US4464571AOpposing field spectrometer for electron beam mensuration technologySIEMENS AG·Filed 1982·Granted Aug 7, 1984·24 cites·6 claims
- 1572US4629899ADeflection lens system for generating a beam of neutral particles of variable cross sectionSIEMENS AG·Filed 1986·Granted Dec 16, 1986·17 cites·8 claims
- 1662US5616920AApparatus for removing ions from an electron beamSIEMENS AG·Filed 1995·Granted Apr 1, 1997·16 cites·10 claims
- 1760US4393308AHigh current electron sourceSIEMENS AG·Filed 1981·Granted Jul 12, 1983·10 cites·6 claims
- 1849US4788495AMethod for the indirect identification of the intensity distribution of particle beam pulses generated in a particle beam measuring instrumentSIEMENS AG·Filed 1986·Granted Nov 29, 1988·11 cites·3 claims
- 1945US5012100AMethod and apparatus for investigating the latch-up propagation in complementary-metal-oxide semiconductor (CMOS) circuitsSIEMENS AG·Filed 1989·Granted Apr 30, 1991·11 cites·14 claims
- 2041US5030829AMethod and apparatus for investigating latch-up propagation in complementary-metal-oxide-semiconductor (CMOS) circuitsSIEMENS AG·Filed 1989·Granted Jul 9, 1991·9 cites·16 claims
- 2136US4507559ADeflection structure for a corpuscular beam blanking system and method for operating sameSIEMENS AG·Filed 1983·Granted Mar 26, 1985·2 cites·7 claims
- 2225US4748324AElectrostatic opposing field spectrometer for electron beam test methodsSIEMENS AG·Filed 1986·Granted May 31, 1988·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →