Inventor · disambiguated record
Pei-Jhen Wu
Also filed as: WU PEI-JHEN
12 granted patents·1 pending application·4 citations·filing 2019–2022
82Inventor score
Files withNANYA TECHNOLOGY CORP13
Top patents by PatentIndex Score
13 records- 0177US10811382B1Method of manufacturing semiconductor deviceNANYA TECHNOLOGY CORP·Filed 2019·Granted Oct 20, 2020·2 cites·15 claims
- 0272US11545571B2Semiconductor device and manufacturing method thereofNANYA TECHNOLOGY CORP·Filed 2021·Granted Jan 3, 2023·0 cites·11 claims
- 0370US11189545B2Semiconductor device and method for manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2019·Granted Nov 30, 2021·1 cites·14 claims
- 0468US11699635B2Method for manufacturing semiconductor deviceNANYA TECHNOLOGY CORP·Filed 2021·Granted Jul 11, 2023·0 cites·6 claims
- 0568US11217560B2Die assembly and method of manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2019·Granted Jan 4, 2022·1 cites·14 claims
- 0667US11776924B2Method of manufacturing semiconductor deviceNANYA TECHNOLOGY CORP·Filed 2021·Granted Oct 3, 2023·0 cites·6 claims
- 0767US11728425B2Manufacturing method of semiconductor deviceNANYA TECHNOLOGY CORP·Filed 2022·Granted Aug 15, 2023·0 cites·10 claims
- 0862US11205607B2Semiconductor structure and method of manufacturing thereofNANYA TECHNOLOGY CORP·Filed 2020·Granted Dec 21, 2021·0 cites·5 claims
- 0962US2022059435A1Semiconductor structure and method of manufacturing thereofNANYA TECHNOLOGY CORP·Filed 2021·Application pending·0 cites
- 1057US11270962B2Semiconductor device and method of manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2019·Granted Mar 8, 2022·0 cites·6 claims
- 1156US11411006B1Manufacturing method of memory structureNANYA TECHNOLOGY CORP·Filed 2021·Granted Aug 9, 2022·0 cites·20 claims
- 1245US10910345B2Semiconductor device with stacked die deviceNANYA TECHNOLOGY CORP·Filed 2019·Granted Feb 2, 2021·0 cites·7 claims
- 1345US10734338B2Bonding pad, semiconductor structure, and method of manufacturing semiconductor structureNANYA TECHNOLOGY CORP·Filed 2019·Granted Aug 4, 2020·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →