Inventor · disambiguated record
Masashi Kurita
Also filed as: KURITA MASASHI
13 granted patents·2 pending applications·31 citations·filing 2011–2021
88Inventor score
Top patents by PatentIndex Score
15 records- 0183US11301978B2Defect inspection device, defect inspection method, and computer readable recording mediumOMRON TATEISI ELECTRONICS CO·Filed 2019·Granted Apr 12, 2022·4 cites·14 claims
- 0283US11240441B2Method, device, system and computer-program product for setting lighting condition and storage mediumOMRON TATEISI ELECTRONICS CO·Filed 2018·Granted Feb 1, 2022·4 cites·20 claims
- 0380US12217411B2Inspection apparatus, unit selection apparatus, inspection method, and computer-readable storage medium storing an inspection programOMRON TATEISI ELECTRONICS CO·Filed 2021·Granted Feb 4, 2025·1 cites·20 claims
- 0480US11176650B2Data generation apparatus, data generation method, and data generation programOMRON TATEISI ELECTRONICS CO·Filed 2018·Granted Nov 16, 2021·4 cites·18 claims
- 0579US10885618B2Inspection apparatus, data generation apparatus, data generation method, and data generation programOMRON TATEISI ELECTRONICS CO·Filed 2018·Granted Jan 5, 2021·4 cites·17 claims
- 0677US10878283B2Data generation apparatus, data generation method, and data generation programOMRON TATEISI ELECTRONICS CO·Filed 2018·Granted Dec 29, 2020·3 cites·19 claims
- 0774US11830174B2Defect inspecting device, defect inspecting method, and storage mediumOMRON TATEISI ELECTRONICS CO·Filed 2019·Granted Nov 28, 2023·2 cites·15 claims
- 0872US9189694B2Image processing device and image processing methodOMRON TATEISI ELECTRONICS CO·Filed 2013·Granted Nov 17, 2015·6 cites·20 claims
- 0971US10776909B2Defect inspection apparatus, defect inspection method, and non-transitory computer readable mediumOMRON TATEISI ELECTRONICS CO·Filed 2018·Granted Sep 15, 2020·2 cites·16 claims
- 1064US11631230B2Method, device, system and computer-program product for setting lighting condition and storage mediumOMRON TATEISI ELECTRONICS CO·Filed 2018·Granted Apr 18, 2023·1 cites·20 claims
- 1155US2024233349A9Integrated model generation method, image inspection system, image inspection model generation device, image inspection model generation program, and image inspection deviceOMRON TATEISI ELECTRONICS CO·Filed 2021·Application pending·0 cites
- 1253US11574397B2Image processing device, image processing method, and computer readable recording mediumOMRON TATEISI ELECTRONICS CO·Filed 2019·Granted Feb 7, 2023·0 cites·8 claims
- 1350US11769248B2Image processing device, image processing method, and image processing non-transitory computer readable medium for verifying detectable range of defect imageOMRON TATEISI ELECTRONICS CO·Filed 2019·Granted Sep 26, 2023·0 cites·17 claims
- 1443US11461996B2Method, apparatus and system for determining feature data of image data, and storage mediumOMRON TATEISI ELECTRONICS CO·Filed 2018·Granted Oct 4, 2022·0 cites·11 claims
- 1530US2012237118A1Image processing device, image processing method, and image processing programHYUGA TADASHI·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →