Inventor · disambiguated record
Masaoki Yamagata
Also filed as: YAMAGATA MASAOKI
27 granted patents·5 pending applications·101 citations·filing 2000–2023
95Inventor score
Top patents by PatentIndex Score
32 records- 0182US6446351B1Linear measuring machineMITUTOYO CORP·Filed 2000·Granted Sep 10, 2002·38 cites·3 claims
- 0281US7318285B2Surface profile measuring instrumentMITUTOYO CORP·Filed 2006·Granted Jan 15, 2008·12 cites·8 claims
- 0377US10895449B2Shape measuring deviceMITUTOYO CORP·Filed 2019·Granted Jan 19, 2021·1 cites·5 claims
- 0477US9354041B2Coordinate measuring apparatusMITUTOYO CORP·Filed 2014·Granted May 31, 2016·4 cites·9 claims
- 0577US8131896B2Signal converter, signal processor and signal conversion transmission systemYAMAGATA MASAOKI·Filed 2010·Granted Mar 6, 2012·6 cites·10 claims
- 0676US8549899B2Surface texture measuring instrumentIGASAKI SHIRO·Filed 2010·Granted Oct 8, 2013·4 cites·8 claims
- 0776US8416426B2Calibrating jig, profile measuring device, and method of offset calculationYAMAGATA MASAOKI·Filed 2012·Granted Apr 9, 2013·4 cites·3 claims
- 0871US8553234B2Shape measurement deviceNEMOTO KENTARO·Filed 2012·Granted Oct 8, 2013·5 cites·2 claims
- 0968US8964281B2Optical probeYAMAGATA MASAOKI·Filed 2012·Granted Feb 24, 2015·2 cites·12 claims
- 1067US8573036B2Surface texture measuring instrumentIGASAKI SHIRO·Filed 2010·Granted Nov 5, 2013·2 cites·5 claims
- 1166US8191408B2Measuring instrumentIGASAKI SHIRO·Filed 2009·Granted Jun 5, 2012·5 cites·3 claims
- 1265US8139229B2Calibrating jig, profile measuring device, and method of offset calculationYAMAGATA MASAOKI·Filed 2009·Granted Mar 20, 2012·4 cites·9 claims
- 1363US7814779B2Surface texture measuring instrumentMITUTOYO CORP·Filed 2007·Granted Oct 19, 2010·3 cites·4 claims
- 1462US9255792B2Optical probe, attachable cover, and shape measuring apparatusMITUTOYO CORP·Filed 2015·Granted Feb 9, 2016·1 cites·12 claims
- 1559US9989356B2Shape measuring apparatusMITUTOYO CORP·Filed 2014·Granted Jun 5, 2018·1 cites·12 claims
- 1659US7882723B2Abnormality detecting method for form measuring mechanism and form measuring mechanismMITUTOYO CORP·Filed 2008·Granted Feb 8, 2011·3 cites·16 claims
- 1759US7701562B2Method of measuring front and back surfaces of target objectMITUTOYO CORP·Filed 2009·Granted Apr 20, 2010·3 cites·4 claims
- 1856US2022290971A1Coordinate measuring apparatusMITUTOYO CORP·Filed 2022·Application pending·0 cites
- 1955US10480930B2Optical displacement measuring instrument, adjustment method and measuring method of optical displacement measuring instrumentMITUTOYO CORP·Filed 2018·Granted Nov 19, 2019·0 cites·8 claims
- 2054US10684109B2Indicator inspection machine, inspection method, and inspection programMITUTOYO CORP·Filed 2018·Granted Jun 16, 2020·0 cites·29 claims
- 2154US7869970B2Probe straightness measuring methodMITUTOYO CORP·Filed 2009·Granted Jan 11, 2011·2 cites·6 claims
- 2253US12352558B2Shape reconstruction method and image measurement deviceMACHINE VISION LIGHTING INC·Filed 2020·Granted Jul 8, 2025·0 cites·15 claims
- 2351US2024212129A1Inspection method, inspection apparatus, and inspection program for disk-shaped graduation plateMITUTOYO CORP·Filed 2023·Application pending·0 cites
- 2451US2024212126A1Inspection method, inspection apparatus, and inspection program for disk-shaped graduation plateMITUTOYO CORP·Filed 2023·Application pending·0 cites
- 2550US10852128B2Shape measuring apparatusMITUTOYO CORP·Filed 2014·Granted Dec 1, 2020·0 cites·19 claims
- 2647US9500474B2Illumination apparatus, illumination method, measuring apparatus, and measuring methodMITUTOYO CORP·Filed 2015·Granted Nov 22, 2016·0 cites·11 claims
- 2745US8643718B2Image measuring apparatusYAMAGATA MASAOKI·Filed 2011·Granted Feb 4, 2014·0 cites·5 claims
- 2843US10119848B2Inspection machine and attachment jig thereforMITUTOYO CORP·Filed 2016·Granted Nov 6, 2018·0 cites·11 claims
- 2943US7769560B2Profiling controlling method and controller for contact type probes, and contact type measuring machineMITUTOYO CORP·Filed 2008·Granted Aug 3, 2010·0 cites·10 claims
- 3040US6510725B2Apparatus and method of inspecting gageMITUTOYO CORP·Filed 2001·Granted Jan 28, 2003·1 cites·17 claims
- 3135US2012262724A1Shape measurement deviceNEMOTO KENTARO·Filed 2012·Application pending·0 cites
- 3234US2015226544A1Optical probe, attachable cover, and shape measuring apparatusMITUTOYO CORP·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →