Inventor · disambiguated record

Yoshikazu Shiina

Also filed as: SHIINA YOSHIKAZU

2 granted patents·4 citations·filing 2004–2005

45Inventor score

Technology areasG01N

Files withSUMCO CORP2

Top patents by PatentIndex Score

2 records

0157US7601538B2Method for analyzing impuritySUMCO CORP·Filed 2005·Granted Oct 13, 2009·1 cites·4 claims
0248US7601541B2Method for detecting Cu concentration of silicon substrateSUMCO CORP·Filed 2004·Granted Oct 13, 2009·3 cites·4 claims

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Yoshikazu Shiina — Patent Inventor | PatentIndex