Inventor · disambiguated record
Erwin Behnen
Also filed as: BEHNEN ERWIN
11 granted patents·1 pending application·28 citations·filing 2003–2019
87Inventor score
Files withIBM12
Top patents by PatentIndex Score
12 records- 0185US10885260B1Fin-based fill cell optimizationIBM·Filed 2019·Granted Jan 5, 2021·4 cites·20 claims
- 0285US10248749B2Automated attribute propagation and hierarchical consistency checking for non-standard extensionsIBM·Filed 2018·Granted Apr 2, 2019·3 cites·20 claims
- 0385US10223487B2Automated attribute propagation and hierarchical consistency checking for non-standard extensionsIBM·Filed 2017·Granted Mar 5, 2019·3 cites·7 claims
- 0485US9977851B2Automated attribute propagation and hierarchical consistency checking for non-standard extensionsIBM·Filed 2017·Granted May 22, 2018·3 cites·17 claims
- 0579US9971861B2Selective boundary overlay insertion for hierarchical circuit designIBM·Filed 2016·Granted May 15, 2018·3 cites·14 claims
- 0678US10699050B2Front-end-of-line shape merging cell placement and optimizationIBM·Filed 2018·Granted Jun 30, 2020·2 cites·19 claims
- 0772US9892222B1Automated attribute propagation and hierarchical consistency checking for non-standard extensionsIBM·Filed 2016·Granted Feb 13, 2018·1 cites·10 claims
- 0864US7225419B2Methods for modeling latch transparencyIBM·Filed 2004·Granted May 29, 2007·8 cites·13 claims
- 0961US11055465B2Fill techniques for avoiding Boolean DRC failures during cell placementIBM·Filed 2019·Granted Jul 6, 2021·0 cites·20 claims
- 1050US7080335B2Methods for modeling latch transparencyIBM·Filed 2003·Granted Jul 18, 2006·1 cites·15 claims
- 1149US11106850B2Flexible constraint-based logic cell placementIBM·Filed 2019·Granted Aug 31, 2021·0 cites·20 claims
- 1243US2008077889A1Parameterized semiconductor chip cells and optimization of the sameIBM·Filed 2006·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Erwin Behnen files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →