Inventor · disambiguated record
Chien-Ping Wang
Also filed as: WANG CHIEN-PING
8 granted patents·2 pending applications·9 citations·filing 2010–2024
78Inventor score
Files withIND TECH RES INST4WANG CHIEN-PING3TAIWAN SEMICONDUCTOR MFG CO LTD2UNIV CHUNG YUAN CHRISTIAN1
Top patents by PatentIndex Score
10 records- 0185US12009177B2Detection using semiconductor detectorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jun 11, 2024·1 cites·20 claims
- 0274US2024290575A1Detection using semiconductor detectorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0373US11306711B2Miniature cooling systemUNIV CHUNG YUAN CHRISTIAN·Filed 2018·Granted Apr 19, 2022·2 cites·10 claims
- 0464US9523572B2Thin-film curvature measurement apparatus and method thereofIND TECH RES INST·Filed 2014·Granted Dec 20, 2016·2 cites·22 claims
- 0563US9726713B2Testing method and testing system for semiconductor elementIND TECH RES INST·Filed 2013·Granted Aug 8, 2017·2 cites·10 claims
- 0663US9557368B2Method of measuring thermal electric characteristics of semiconductor deviceWANG CHIEN-PING·Filed 2012·Granted Jan 31, 2017·2 cites·19 claims
- 0741US9341669B2Testing apparatusIND TECH RES INST·Filed 2013·Granted May 17, 2016·0 cites·24 claims
- 0837US9110125B2Method and apparatus for detecting relationship between thermal and electrical properties of semiconductor deviceWANG CHIEN-PING·Filed 2012·Granted Aug 18, 2015·0 cites·12 claims
- 0936US2011133769A1Inspection apparatus and method for led package interfaceIND TECH RES INST·Filed 2010·Application pending·0 cites
- 1033US8773158B2Inspection methodWANG CHIEN-PING·Filed 2011·Granted Jul 8, 2014·0 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →