Inventor · disambiguated record
Harland Glenn Hopkins
Also filed as: HOPKINS HARLAND G · HOPKINS HARLAND GLENN
11 granted patents·2 pending applications·246 citations·filing 1985–2008
91Inventor score
Top patents by PatentIndex Score
13 records- 0189US4664453AAnti-lock brake control systemGEN MOTORS CORP·Filed 1985·Granted May 12, 1987·32 cites·5 claims
- 0286US6691216B2Shared program memory for use in multicore DSP devicesTEXAS INSTRUMENTS INC·Filed 2001·Granted Feb 10, 2004·52 cites·24 claims
- 0385US6895479B2Multicore DSP device having shared program memory with conditional write protectionTEXAS INSTRUMENTS INC·Filed 2001·Granted May 17, 2005·47 cites·22 claims
- 0480US6920572B2Unanimous voting for disabling of shared component clocking in a multicore DSP deviceTEXAS INSTRUMENTS INC·Filed 2001·Granted Jul 19, 2005·37 cites·17 claims
- 0570US6892266B2Multicore DSP device having coupled subsystem memory buses for global DMA accessTEXAS INSTRUMENTS INC·Filed 2001·Granted May 10, 2005·16 cites·10 claims
- 0667US7006521B2External bus arbitration technique for multicore DSP deviceTEXAS INSTRUMENTS INC·Filed 2001·Granted Feb 28, 2006·13 cites·18 claims
- 0758US4783127AAnti-lock brake control systemGEN MOTORS CORP·Filed 1987·Granted Nov 8, 1988·21 cites·7 claims
- 0846US5974498ALoading page register with page value in branch instruction for as fast access to memory extension as in-page accessTEXAS INSTRUMENTS INC·Filed 1996·Granted Oct 26, 1999·20 cites·10 claims
- 0943US7089447B2Apparatus and method for compression based error correction procedure in a data processing systemTEXAS INSTRUMENTS INC·Filed 2003·Granted Aug 8, 2006·0 cites·15 claims
- 1037US2010169037A1Flash memory threshold voltage characterizationTEXAS INSTRUMENTS INC·Filed 2008·Application pending·0 cites
- 1136US5416843ADevices, systems and methods for composite signal decodingTEXAS INSTRUMENTS INC·Filed 1992·Granted May 16, 1995·8 cites·9 claims
- 1236US2010169742A1Flash memory soft error recoveryTEXAS INSTRUMENTS INC·Filed 2008·Application pending·0 cites
- 1334US6647525B1Electronics testing circuit and methodTEXAS INSTRUMENTS INC·Filed 2000·Granted Nov 11, 2003·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →