Inventor · disambiguated record
Sung-Hwan In
Also filed as: IN SUNG-HWAN
2 granted patents·1 pending application·29 citations·filing 2003–2004
59Inventor score
Files withSAMSUNG ELECTRONICS CO LTD2
Top patents by PatentIndex Score
3 records- 0177US6888366B2Apparatus and method for testing a plurality of semiconductor chipsSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted May 3, 2005·25 cites·11 claims
- 0240US6990617B2Semiconductor memory device and test method of the sameSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jan 24, 2006·4 cites·17 claims
- 0331US2005083217A1Method for transmitting and receiving signals in semiconductor device and semiconductor device thereofFiled 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →