Inventor · disambiguated record
Takeo Ushiki
Also filed as: USHIKI TAKEO
19 granted patents·619 citations·filing 1998–2008
96Inventor score
Top patents by PatentIndex Score
19 records- 0197US6768324B1Semiconductor device tester which measures information related to a structure of a sample in a depth directionFAB SOLUTIONS INC·Filed 2000·Granted Jul 27, 2004·141 cites·35 claims
- 0295US7385195B2Semiconductor device testerTOPCON CORP·Filed 2005·Granted Jun 10, 2008·25 cites·13 claims
- 0394US6255731B1SOI bonding structureCANON KK·Filed 1998·Granted Jul 3, 2001·179 cites·58 claims
- 0491US6559662B1Semiconductor device tester and semiconductor device test methodFAB SOLUTIONS INC·Filed 2000·Granted May 6, 2003·59 cites·31 claims
- 0587US6683308B2Method and apparatus for measuring thickness of thin filmFAB SOLUTIONS INC·Filed 2003·Granted Jan 27, 2004·51 cites·18 claims
- 0686US6946857B2Semiconductor device testerFAB SOLUTIONS INC·Filed 2004·Granted Sep 20, 2005·25 cites·25 claims
- 0786US6614244B2Semiconductor device inspecting apparatusFAB SOLUTIONS INC·Filed 2001·Granted Sep 2, 2003·35 cites·13 claims
- 0883US6850079B2Film thickness measuring apparatus and a method for measuring a thickness of a filmFAB SOLUTIONS INC·Filed 2003·Granted Feb 1, 2005·16 cites·32 claims
- 0982US6975125B2Semiconductor device testerFAB SOLUTIONS INC·Filed 2004·Granted Dec 13, 2005·19 cites·42 claims
- 1076US7321805B2Production managing system of semiconductor deviceFAB SOLUTIONS INC·Filed 2004·Granted Jan 22, 2008·14 cites·38 claims
- 1170US7795593B2Surface contamination analyzer for semiconductor wafersTOPCON CORP·Filed 2008·Granted Sep 14, 2010·2 cites·18 claims
- 1270US7700380B2Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor deviceTOPCON CORP·Filed 2005·Granted Apr 20, 2010·2 cites·13 claims
- 1369US6711453B2Production managing system of semiconductor deviceFAB SOLUTIONS INC·Filed 2002·Granted Mar 23, 2004·10 cites·17 claims
- 1468US6943043B2Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor deviceFAB SOLUTIONS INC·Filed 2004·Granted Sep 13, 2005·8 cites·21 claims
- 1560US6842663B2Production managing system of semiconductor deviceFAB SOLUTIONS INC·Filed 2004·Granted Jan 11, 2005·5 cites·11 claims
- 1659US6753194B2Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor deviceFAB SOLUTIONS INC·Filed 2002·Granted Jun 22, 2004·5 cites·6 claims
- 1754US6258244B1Treating method and apparatus utilizing chemical reactionCANON KK·Filed 1998·Granted Jul 10, 2001·19 cites·42 claims
- 1850US6837936B2Semiconductor manufacturing deviceFAB SOLUTIONS INC·Filed 2002·Granted Jan 4, 2005·2 cites·28 claims
- 1945US7002361B2Film thickness measuring apparatus and a method for measuring a thickness of a filmFAB SOLUTIONS INC·Filed 2004·Granted Feb 21, 2006·2 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →