Inventor · disambiguated record
Witawat Wijaranakula
Also filed as: WIJARANAKULA WITAWAT
9 granted patents·362 citations·filing 1993–1999
91Inventor score
Top patents by PatentIndex Score
9 records- 0191US5611855AMethod for manufacturing a calibration wafer having a microdefect-free layer of a precisely predetermined depthSEH AMERICA INC·Filed 1995·Granted Mar 18, 1997·131 cites·12 claims
- 0288US6022793ASilicon and oxygen ion co-implantation for metallic gettering in epitaxial wafersSEH AMERICA INC·Filed 1997·Granted Feb 8, 2000·84 cites·9 claims
- 0381US5629216AMethod for producing semiconductor wafers with low light scattering anomaliesSEH AMERICA INC·Filed 1996·Granted May 13, 1997·54 cites·12 claims
- 0473US5865887AMethod for improving mechanical strength of the neck section of czochralski silicon crystalSEH AMERICA INC·Filed 1997·Granted Feb 2, 1999·23 cites·12 claims
- 0564US5961713AMethod for manufacturing a wafer having a microdefect-free layer of a precisely predetermined depthSEH AMERICA INC·Filed 1997·Granted Oct 5, 1999·27 cites·12 claims
- 0652US5306939AEpitaxial silicon wafers for CMOS integrated circuitsSEH AMERICA·Filed 1993·Granted Apr 26, 1994·14 cites·17 claims
- 0749US6569749B1Silicon and oxygen ion co-implanation for metallic gettering in epitaxial wafersSEH AMERICA INC·Filed 1999·Granted May 27, 2003·12 cites·14 claims
- 0847USD394703SPair of ball shaped odor absorbing material containers attached together with a flexible stringINFOTIX SYSTEMS INC·Filed 1996·Granted May 26, 1998·8 cites·1 claims
- 0945US5827367AApparatus for improving mechanical strength of the neck section of czochralski silicon crystalSEH AMERICA·Filed 1996·Granted Oct 27, 1998·9 cites·45 claims
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