Inventor · disambiguated record
Bradley David Sucher
Also filed as: SUCHER BRADLEY · SUCHER BRADLEY D · SUCHER BRADLEY DAVID
14 granted patents·4 pending applications·13 citations·filing 2003–2019
87Inventor score
Top patents by PatentIndex Score
18 records- 0183US10032663B1Anneal after trench sidewall implant to reduce defectsTEXAS INSTRUMENTS INC·Filed 2017·Granted Jul 24, 2018·4 cites·11 claims
- 0281US9496313B2CMOS-based thermopile with reduced thermal conductanceTEXAS INSTRUMENTS INC·Filed 2014·Granted Nov 15, 2016·4 cites·5 claims
- 0371US10002870B2Process enhancement using double sided epitaxial on substrateTEXAS INSTRUMENTS INC·Filed 2016·Granted Jun 19, 2018·1 cites·20 claims
- 0470US9853086B2CMOS-based thermopile with reduced thermal conductanceTEXAS INSTRUMENTS INC·Filed 2016·Granted Dec 26, 2017·1 cites·14 claims
- 0563US11056490B2Process enhancement using double sided epitaxial on substrateTEXAS INSTRUMENTS INC·Filed 2019·Granted Jul 6, 2021·0 cites·20 claims
- 0662US7592252B2Versatile system for charge dissipation in the formation of semiconductor device structuresTEXAS INSTRUMENTS INC·Filed 2006·Granted Sep 22, 2009·2 cites·9 claims
- 0759US10304827B2Process enhancement using double sided epitaxial on substrateTEXAS INSTRUMENTS INC·Filed 2018·Granted May 28, 2019·0 cites·20 claims
- 0856US8753961B2Thermal budget optimization for yield enhancement on bulk silicon wafersSUCHER BRADLEY DAVID·Filed 2012·Granted Jun 17, 2014·1 cites·13 claims
- 0954US10438837B2Anneal after trench sidewall implant to reduce defectsTEXAS INSTRUMENTS INC·Filed 2018·Granted Oct 8, 2019·0 cites·18 claims
- 1047US7671445B2Versatile system for charge dissipation in the formation of semiconductor device structuresTEXAS INSTRUMENTS INC·Filed 2006·Granted Mar 2, 2010·0 cites·22 claims
- 1145US2015118861A1Czochralski substrates having reduced oxygen donorsTEXAS INSTRUMENTS INC·Filed 2014·Application pending·0 cites
- 1245US2015187597A1Method to improve slip resistance of silicon wafersTEXAS INSTRUMENTS INC·Filed 2014·Application pending·0 cites
- 1344US10304721B1Formation of isolation layers using a dry-wet-dry oxidation techniqueTEXAS INSTRUMENTS INC·Filed 2017·Granted May 28, 2019·0 cites·17 claims
- 1439US7119444B2Versatile system for charge dissipation in the formation of semiconductor device structuresTEXAS INSTRUMENTS INC·Filed 2004·Granted Oct 10, 2006·0 cites·12 claims
- 1538US8053324B2Method of manufacturing a semiconductor device having improved transistor performanceTEXAS INSTRUMENTS INC·Filed 2007·Granted Nov 8, 2011·0 cites·19 claims
- 1637US8759198B2Accelerated furnace ramp rates for reduced slipSUCHER BRADLEY DAVID·Filed 2012·Granted Jun 24, 2014·0 cites·17 claims
- 1736US2004110013A1Method of increasing mechanical properties of semiconductor substratesFiled 2003·Application pending·0 cites
- 1830US2006009011A1Method for recycling/reclaiming a monitor waferTEXAS INSTRUMENTS INC·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →