Inventor · disambiguated record
Noriyuki Aizawa
Also filed as: AIZAWA NORIYUKI
3 granted patents·3 pending applications·4 citations·filing 2005–2017
58Inventor score
Top patents by PatentIndex Score
6 records- 0179US7746461B2Optical defect inspection apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted Jun 29, 2010·4 cites·5 claims
- 0251US2011102781A1Optical defect inspection apparatusHITACHI HIGH TECH CORP·Filed 2011·Application pending·0 cites
- 0351US2007211241A1Optical defect inspection apparatusAIZAWA NORIYUKI·Filed 2007·Application pending·0 cites
- 0450US7894052B2Optical defect inspection apparatusHITACHI HIGH TECH CORP·Filed 2010·Granted Feb 22, 2011·0 cites·5 claims
- 0536US2020191809A1Sample transport systemHITACHI HIGH TECH CORP·Filed 2017·Application pending·0 cites
- 0633US8036338B2Method and device for simultaneous measurement of magnetostriction and magnetizationTOKYO GAKUGEI UNIVERSITY·Filed 2005·Granted Oct 11, 2011·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →